Spectroscopic Ellipsometry for Photovoltaics Volume 1: Fundamental Principles and Solar Cell Characterization /

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid per...

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Médium: Elektronický zdroj E-kniha
Jazyk:angličtina
Vydáno: Cham : Springer International Publishing, 2018.
Vydání:1st ed. 2018.
Edice:Springer Series in Optical Sciences, 212
Témata:
Lasers.
Photonics.
Optical materials.
Electronic materials.
Microwaves.
Optical engineering.
Renewable energy resources.
ISBN:9783319753775
ISSN:0342-4111 ;
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Obsah:
  • Introduction
  • Part I: Fundamental Principles of Ellipsometry
  • Measurement Technique of Ellipsometry
  • Data Analysis
  • Optical Properties of Semiconductors
  • Dielectric Function Modeling
  • Effect of Roughness on Ellipsometry Analysis
  • Part II: Characterization of Materials and Structures
  • Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon
  • Crystalline Silicon Solar Cells
  • Amorphous/Crystalline Si Heterojunction Solar Cells
  • Optical Properties of Cu(In,Ga)Se2
  • Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization
  • Cu2ZnSn(S,Se)4 and Related Materials
  • Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics
  • High Efficiency III-V Solar Cells
  • Organic Solar Cells
  • Organic-Inorganic Hybrid Perovskite Solar Cells
  • Solar Cells with Photonic and Plasmonic Structures
  • Transparent Conductive Oxide Materials
  • High-Mobility Transparent Conductive Oxide Layers.

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