Spectroscopic Ellipsometry for Photovoltaics Volume 1: Fundamental Principles and Solar Cell Characterization /
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid per...
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| Médium: | Elektronický zdroj E-kniha |
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| Jazyk: | angličtina |
| Vydáno: |
Cham :
Springer International Publishing,
2018.
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| Vydání: | 1st ed. 2018. |
| Edice: | Springer Series in Optical Sciences,
212 |
| Témata: | |
| ISBN: | 9783319753775 |
| ISSN: | 0342-4111 ; |
| On-line přístup: |
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| Shrnutí: | This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers. |
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| Popis jednotky: | Physics and Astronomy |
| Fyzický popis: | XX, 594 p. 336 illus., 266 illus. in color. online resource. |
| ISBN: | 9783319753775 |
| ISSN: | 0342-4111 ; |