Progress in Nanoscale Characterization and Manipulation

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, i...

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Bibliographic Details
Format: Electronic eBook
Language:English
Published: Singapore : Springer Singapore , 2018.
Edition:1st ed. 2018.
Series:Springer Tracts in Modern Physics, 272
Subjects:
ISBN:9789811304545
ISSN:0081-3869 ;
Online Access: Get full text
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Table of Contents:
  • Electron/Ion Optics
  • Scanning Electron Microscopy
  • Transmission Electron Microscopy
  • Scanning Transmission Electron Microscopy (STEM)
  • Spectroscopy
  • Aberration Corrected Transmission Electron Microscopy and Its Applications
  • In situ TEM: Theory and Applications
  • Helium Ion Microscopy.