Progress in Nanoscale Characterization and Manipulation
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, i...
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| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Singapore :
Springer Singapore ,
2018.
|
| Edition: | 1st ed. 2018. |
| Series: | Springer Tracts in Modern Physics,
272 |
| Subjects: | |
| ISBN: | 9789811304545 |
| ISSN: | 0081-3869 ; |
| Online Access: |
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Table of Contents:
- Electron/Ion Optics
- Scanning Electron Microscopy
- Transmission Electron Microscopy
- Scanning Transmission Electron Microscopy (STEM)
- Spectroscopy
- Aberration Corrected Transmission Electron Microscopy and Its Applications
- In situ TEM: Theory and Applications
- Helium Ion Microscopy.

