Progress in Nanoscale Characterization and Manipulation
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, i...
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| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Singapore :
Springer Singapore ,
2018.
|
| Edition: | 1st ed. 2018. |
| Series: | Springer Tracts in Modern Physics,
272 |
| Subjects: | |
| ISBN: | 9789811304545 |
| ISSN: | 0081-3869 ; |
| Online Access: |
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| 041 | |a eng | ||
| 245 | 1 | 0 | |a Progress in Nanoscale Characterization and Manipulation |h [electronic resource] / |c edited by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai. |
| 250 | |a 1st ed. 2018. | ||
| 260 | 1 | |a Singapore : |b Springer Singapore , |c 2018. | |
| 300 | |a VII, 508 p. 333 illus., 26 illus. in color. |b online resource. | ||
| 490 | 1 | |a Springer Tracts in Modern Physics, |x 0081-3869 ; |v 272 | |
| 500 | |a Physics and Astronomy | ||
| 505 | 0 | |a Electron/Ion Optics -- Scanning Electron Microscopy -- Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy (STEM) -- Spectroscopy -- Aberration Corrected Transmission Electron Microscopy and Its Applications -- In situ TEM: Theory and Applications -- Helium Ion Microscopy. | |
| 516 | |a text file PDF | ||
| 520 | |a This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. | ||
| 650 | 0 | |a Nanoscale science. | |
| 650 | 0 | |a Nanoscience. | |
| 650 | 0 | |a Nanostructures. | |
| 650 | 0 | |a Materials science. | |
| 650 | 0 | |a Spectroscopy. | |
| 650 | 0 | |a Microscopy. | |
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