Progress in Nanoscale Characterization and Manipulation
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, i...
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| Format: | Elektronisch E-Book |
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| Sprache: | Englisch |
| Veröffentlicht: |
Singapore :
Springer Singapore ,
2018.
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| Ausgabe: | 1st ed. 2018. |
| Schriftenreihe: | Springer Tracts in Modern Physics,
272 |
| Schlagworte: | |
| ISBN: | 9789811304545 |
| ISSN: | 0081-3869 ; |
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| Zusammenfassung: | This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field. |
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| Beschreibung: | Physics and Astronomy |
| Beschreibung: | VII, 508 p. 333 illus., 26 illus. in color. online resource. |
| ISBN: | 9789811304545 |
| ISSN: | 0081-3869 ; |