Photometric determination of traces of metals : general aspects /
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| Main Authors: | , |
|---|---|
| Format: | Book |
| Language: | Czech |
| Published: |
New York :
John Wiley & Sons,
1978
|
| Edition: | 4th ed. |
| Series: | rz1
|
| Online Access: |
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| LEADER | 00000cam a2200000 4500 | ||
|---|---|---|---|
| 003 | SK-BrCVT | ||
| 005 | 20220618081806.0 | ||
| 008 | 091015s1978 cs e ||||||cze d | ||
| 035 | |a CVTIDWR024034 | ||
| 040 | |a |b slo |c |d | ||
| 041 | 0 | |a cze | |
| 044 | |a cs | ||
| 100 | |a Sandell, Ernest Birger |4 aut | ||
| 245 | 1 | 0 | |a Photometric determination of traces of metals : |b general aspects / |c Ernest Birger Sandell, Hiroshi Onishi |
| 250 | |a 4th ed. | ||
| 260 | 3 | |a New York : |b John Wiley & Sons, |c 1978 | |
| 300 | |a 9, 1085 s. | ||
| 700 | |a Onishi, Hiroshi |4 aut | ||
| 830 | |a rz1 | ||
| 974 | |f Knihy | ||
| 999 | |c 197942 |d 197942 | ||