Methods of measurement for semiconductor materials, process control, and devices /
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| Weitere Verfasser: | |
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| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Washington :
United States Department of Commerce,
1971
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| Ausgabe: | [1st ed.] |
| Schlagworte: | |
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| 245 | 1 | 0 | |a Methods of measurement for semiconductor materials, process control, and devices / |c Edited by: Bullis Murray |
| 250 | |a [1st ed.] | ||
| 260 | |a Washington : |b United States Department of Commerce, |c 1971 | ||
| 300 | |a 6, 67 s., príl. | ||
| 653 | 1 | |a metóda merania |a polovodičový materiál |a polovodičová súčiastka | |
| 700 | 1 | |a Murray, Bullis |4 edt | |
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