APA (7th ed.) Citation

Murray, B. (1971). Methods of measurement for semiconductor materials, process control, and devices ([1st ed.].). United States Department of Commerce.

Chicago Style (17th ed.) Citation

Murray, Bullis. Methods of Measurement for Semiconductor Materials, Process Control, and Devices. [1st ed.]. Washington: United States Department of Commerce, 1971.

MLA (9th ed.) Citation

Murray, Bullis. Methods of Measurement for Semiconductor Materials, Process Control, and Devices. [1st ed.]. United States Department of Commerce, 1971.