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Fundamentals of modern VLSI devices /

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Bibliographic Details
Main Authors:	Taur, Yuan (Author), Ning, Tak H. (Author)
Format:	Book
Language:	English
Published:	Cambridge : Cambridge University Press, 2010
Edition:	2nd ed., reprinted
Subjects:	elektronika veľmi vysoká integrácia bipolárny tranzistor pamäťové zariadenie digitálny obvod analógový obvod integrovaný obvod
ISBN:	9780521832946
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