International test conference. 2003 : Proceedings, Charlotte, NC, USA, Sept. 30 - Oct. 2, 2003 /

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Bibliographic Details
Main Author: Portal, J. M.
Corporate Author: Proceedings NC, USA, Charlotte
Format: Conference Proceeding Book
Language:English
Published: Piscataway : Institute of Electrical and Electronics Engineers, 2003
Edition:[1st ed.]
Subjects:
ISBN:0780381068
ISSN:1089-3539
Online Access: Get full text
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