Defect and fault tolerance in VLSI systems : proceedings, Montréal, Québec, Canada, October 17 - 19, 1994 /

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Bibliographic Details
Main Author: Shen, Y.-N (Author)
Format: Book
Language:English
Published: Los Alamitos : IEEE Computer Society Press, 1994
Edition:[1st ed.]
Subjects:
architektúra > zosilňovač > metóda rekonfigurácie > kódovanie > samoopravný kód
zborníky
ISBN:0818663073
ISSN:1063-6722
Online Access: Get full text
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