Defect and fault tolerance in VLSI systems : proceedings, Montréal, Québec, Canada, October 17 - 19, 1994 /
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| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Los Alamitos :
IEEE Computer Society Press,
1994
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| Ausgabe: | [1st ed.] |
| Schlagworte: | |
| ISBN: | 0818663073 |
| ISSN: | 1063-6722 |
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| 245 | 1 | 0 | |a Defect and fault tolerance in VLSI systems : |b proceedings, Montréal, Québec, Canada, October 17 - 19, 1994 / |c authors: Y.-N. Shen ... [et al.] |
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