APA (7th ed.) Citation

Mubarak, F., Phung, G. N., Arz, U., Haddadi, K., Roch-Jeune, I., Ducournau, G., . . . Shang, X. (2025). An Interlaboratory Comparison of On-Wafer S-Parameter Measurements up to 1.1 THz. IEEE Transactions on Terahertz Science and Technology, 15(3), 344-358. https://doi.org/10.1109/TTHZ.2025.3537461

Chicago Style (17th ed.) Citation

Mubarak, Faisal, et al. "An Interlaboratory Comparison of On-Wafer S-Parameter Measurements Up to 1.1 THz." IEEE Transactions on Terahertz Science and Technology 15, no. 3 (2025): 344-358. https://doi.org/10.1109/TTHZ.2025.3537461.

MLA (9th ed.) Citation

Mubarak, Faisal, et al. "An Interlaboratory Comparison of On-Wafer S-Parameter Measurements Up to 1.1 THz." IEEE Transactions on Terahertz Science and Technology, vol. 15, no. 3, 2025, pp. 344-358, https://doi.org/10.1109/TTHZ.2025.3537461.