Ranjan, A., Zeng, L., & Olsson, E. (2024). Dielectric Breakdown Mechanisms in High-κ Antimony Trioxide (Sb 2 O 3 ). ACS Applied Electronic Materials, 6(11), 8540. https://doi.org/10.1021/acsaelm.4c01818
Chicago Style (17th ed.) CitationRanjan, Alok, Lunjie Zeng, and Eva Olsson. "Dielectric Breakdown Mechanisms in High-κ Antimony Trioxide (Sb 2 O 3 )." ACS Applied Electronic Materials 6, no. 11 (2024): 8540. https://doi.org/10.1021/acsaelm.4c01818.
MLA (9th ed.) CitationRanjan, Alok, et al. "Dielectric Breakdown Mechanisms in High-κ Antimony Trioxide (Sb 2 O 3 )." ACS Applied Electronic Materials, vol. 6, no. 11, 2024, p. 8540, https://doi.org/10.1021/acsaelm.4c01818.
Warning: These citations may not always be 100% accurate.