Apparatus and method for generating interference fringe pattern
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| Title: | Apparatus and method for generating interference fringe pattern |
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| Patent Number: | 9,417,608 |
| Publication Date: | August 16, 2016 |
| Appl. No: | 14/098942 |
| Application Filed: | December 06, 2013 |
| Abstract: | An apparatus for generating holograms includes a laser source configured to emit a laser beam with a frequency of v; an acoustic optical modulator configured to generate, from the laser beam, a first beam with a frequency of v1 and a second beam with a frequency of v2; a first beam splitter configured to split the first beam into a first reference beam and a first object beam, the first object beam being led to a sample; a second beam splitter configured to split the second beam into a second reference beam and a second object beam, the second object beam being led to the sample; and a detector configured to detect an image composed of a first fringe, based on the first reference beam and the first object beam, and a second fringe, based on the second reference beam and the second object beam. |
| Inventors: | CANON KABUSHIKI KAISHA (Tokyo, JP) |
| Assignees: | Canon Kabushiki Kaisha (Tokyo, JP) |
| Claim: | 1. An apparatus for detecting an interference fringe pattern comprising: a laser source configured to emit a laser beam with a frequency of v, an acoustic optical modulator configured to generate, from the laser beam, a first beam with a frequency of v 1 and a second beam with a frequency of v 2 different from the frequency of v 1 ; a first beam splitter configured to split the first beam into a first reference beam and a first object beam, the first object beam being led to a sample with a first incident angle; a second beam splitter configured to split the second beam into a second reference beam and a second object beam, the second object beam being led to the sample with a second incident angle different from the first incident angle; and a detector configured to detect, at an exposure time, an image composed of a first interference fringe pattern, based on the first reference beam and the first object beam, and a second interference fringe pattern, based on the second reference beam and the second object beam, wherein the inverse of Δv (Δv=|v 2 −v 1 |) is shorter than the exposure time so that the detector does not detect interference fringe patterns due to a first pair of the first and second reference beams, a second pair of the first and second object beams, a third pair of the first reference beam and the second object beam, and a fourth pair of the second reference beam and the first object beam, and wherein the exposure time is set at milli-second order and the inverse of Δv is set at sub micro-second order. |
| Claim: | 2. The apparatus for detecting an interference fringe pattern according to claim 1 , further comprising a first optical fiber and a second optical fiber, wherein the first object beam is connected to the first optical fiber and the second object beam is connected to the second optical fiber. |
| Claim: | 3. The apparatus for detecting an interference fringe pattern according to claim 2 , wherein at least one of the optical fiber is provided with a rotating plate to change an incident angle to the sample. |
| Claim: | 4. A holographic microscope comprising: a laser source configured to emit a laser beam with a frequency of v, an acoustic optical modulator configured to generate, from the laser beam, a first beam with a frequency of v 1 and a second beam with a frequency of v 2 different from the frequency of v 1 ; a first beam splitter configured to split the first beam into a first reference beam and a first object beam, the first object beam being led to a sample with a first incident angle; a second beam splitter configured to split the second beam into a second reference beam and a second object beam, the second object beam being led to the sample with a second incident angle different from the first incident angle; a detector configured to detect, at an exposure time, an image composed of a first interference fringe pattern, based on the first reference beam and the first object beam, and a second interference fringe pattern, based on the second reference beam and the second object beam; and a calculation unit configured to calculate a reconstructed image of the sample by using the image composed of the first and second interference fringe patterns, wherein the inverse of Δv (Δv=|v 2 −v 1 |) is shorter than the exposure time so that the detector does not detect interference fringe patterns due to a first pair of the first and second reference beams, a second pair of the first and second object beams, a third pair of the first reference beam and the second object beam, and a fourth pair of the second reference beam and the first object beam, and wherein the exposure time is set at milli-second order and the inverse of Δv is set at sub micro-second order. |
| Claim: | 5. An apparatus for detecting an interference fringe pattern comprising: a laser source configured to emit a laser beam with a frequency of v, an acoustic optical modulator configured to generate, from the laser beam, a first beam with a frequency of v 1 and a second beam with a frequency of v 2 different from the frequency of v 1 ; a first beam splitter configured to split the first beam into a first reference beam and a first object beam, the first object beam being led to a sample with a first incident angle; a second beam splitter configured to split the second beam into a second reference beam and a second object beam, the second object beam being led to the sample with a second incident angle different from the first incident angle; and a detector configured to detect, at an exposure time, an interference fringe pattern formed by the first reference beam, the first object beam, the second reference beam and the second object beam, wherein the inverse of Δv (Δv=|v 2 −v 1 |) is shorter than the exposure time so that an interference fringe due to a first pair of the first and second object beams is not detected, and wherein the exposure time is set at milli-second order and the inverse of Δv is set at sub micro-second order. |
| Claim: | 6. The apparatus for detecting the interference fringe pattern according to claim 5 , wherein the inverse of Δv (Δv=|v 2 −v 1 |) is shorter than the exposure time so that an interference fringe due to a pair of a second pair of the first reference beam and the second object beam, and a third pair of the second reference beam and the first object beam. |
| Claim: | 7. The apparatus for detecting an interference fringe pattern according to claim 5 , further comprising an optical fiber to lead the first object beams toward the sample. |
| Claim: | 8. The apparatus for detecting an interference fringe pattern according to claim 7 , further comprising a rotating plate, wherein the optical fiber is connected to the rotating plate to change the first incident angle of the first object beam. |
| Claim: | 9. The apparatus for detecting the interference fringe pattern according to claim 5 , further comprising a first polarizer for the first and second reference beams and a second polarizer for the first and second object beams. |
| Patent References Cited: | 5650855 July 1997 Kirsch 5684592 November 1997 Mitchell 6512735 January 2003 Takeda 2002/0163680 November 2002 Zabka 2006/0262316 November 2006 Baney 2009/0125242 May 2009 Choi 2013/0222786 August 2013 Hanson 2013/0286403 October 2013 Matsubara et al. |
| Other References: | Alejandro Calabuig, Vicente Micó, Javier Garcia, Zeev Zalevsky, Carlos Ferreira, Single-Exposure Super-Resolved Interferometric Microscopy by Red-Green-Blue Multiplexing, Optics Letters, Mar. 15, 2011, 36(6):885-887, Optical Society of America, Washington DC, 2011. cited by applicant Wei Jia, Zhongyu Chen, Fung Jacky Wen, Changhe Zhou, Yuk Tak Chow, and Po Sheun Chung, Single-Beam Data Encoding Using a Holographic Angular Multiplexing Technique, Applied Optics, Dec. 1, 2011, 50(34):H30-H35, Optical Society of America, Washington DC, 2011. cited by applicant Jonas Kühn, Tristan Colomb, Frédéric Montfort, Florian Charrière, Yves Emery, Etienne Cuche, Pierre Marquet, Christian Depeursinge, Real-Time Dual-Wavelength Digital Holographic Microscopy with a Single Hologram Acquisition, Optics Express, Jun. 11, 2007, 15(12):7231-7242, Optical Society of America, Washington DC, 2007. cited by applicant Jonas Kühn, Tristan Colomb, Frédéric Montfort, Florian Charrière, Christian Depeursinge, Real-Time Dual-Wavelength Digital Holographic Microscopy with a Single Hologram, SPIE Europe, Optical Metrology, Optical Measurement Systems for Industrial Inspection V, Munich, DE, Jun. 18-22, 2007, Proceedings of the SPIE, 2007, vol. 6616, article 661615, pp. 661615-1-661615-9, Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, 2007. cited by applicant J. Kühn, F. Charrière, T. Colomb, E. Cuche, F. Montfort, Y. Emery, P. Marquet, C Depeursinge, Axial Sub-Nanometer Accuracy in Digital Holographic Microscopy, Measurement Science and Technology, Jul. 2008, vol. 19, No. 7, article 074007, pp. 1-8, IOP Publishing Ltd. Bristol, UK, 2008. cited by applicant Christopher J. Mann, Philip R. Bingham, Henry K. Lin, Vincent C. Paquit, Shaun S. Gleason, Dual Modality Live Cell Imaging with Multiple-Wavelength Digital Holography and Epi-Fluorescence, 3D Research Express, Nov. 2011, vol. 2, No. 1, article 5, pp. 1-6, Springer, Berlin, DE, 2011. cited by applicant M. Paturzo, P. Memmolo, A. Tulino, A. Finizio, P. Ferraro, Investigation of Angular Multiplexing and De-Multiplexing of Digital Holograms Recorded in Microscope Configuration, Optics Express, May 25, 2009, 17(11):8710-8718, Optical Society of America, Washington DC, 2009. cited by applicant Tatsuki Tahara, Akifumi Maeda, Yasuhiro Awatsuji, Takashi Kakue, Peng Xia, Kenzo Nishio, Shogo Ura, Toshihiro Kubota, Osamu Matoba, Single-Shot Dual-Illumination Phase Unwrapping Using a Single Wavelength, Optics Letters, Oct. 1, 2012, 37(19):4002-4004, Optical Society of America, Washington DC, 2012. cited by applicant |
| Primary Examiner: | Tran, William |
| Attorney, Agent or Firm: | Canon U.S.A., Inc. IP Division |
| Accession Number: | edspgr.09417608 |
| Database: | USPTO Patent Grants |
| Abstract: | An apparatus for generating holograms includes a laser source configured to emit a laser beam with a frequency of v; an acoustic optical modulator configured to generate, from the laser beam, a first beam with a frequency of v1 and a second beam with a frequency of v2; a first beam splitter configured to split the first beam into a first reference beam and a first object beam, the first object beam being led to a sample; a second beam splitter configured to split the second beam into a second reference beam and a second object beam, the second object beam being led to the sample; and a detector configured to detect an image composed of a first fringe, based on the first reference beam and the first object beam, and a second fringe, based on the second reference beam and the second object beam. |
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