Podrobná bibliografia
| Názov: |
Sparse coding-based multiframe superresolution for efficient synchrotron radiation microspectroscopy |
| Autori: |
Yasuhiko Igarashi, Naoka Nagamura, Masahiro Sekine, Hirokazu Fukidome, Hideitsu Hino, Masato Okada |
| Zdroj: |
Discover Nano, Vol 20, Iss 1, Pp 1-20 (2025) |
| Informácie o vydavateľovi: |
Springer, 2025. |
| Rok vydania: |
2025 |
| Zbierka: |
LCC:Materials of engineering and construction. Mechanics of materials |
| Predmety: |
Sparse coding superresolution, Nanostructure image enhancement, Measurement image analysis, Synchrotron image reconstruction, High-resolution microscopy, Radiation damage reduction, Materials of engineering and construction. Mechanics of materials, TA401-492 |
| Popis: |
Abstract In nanostructure extraction, advanced techniques like synchrotron radiation and electron microscopy are often hindered by radiation damage and charging artifacts from long exposure times. This study presents a multiframe superresolution method using sparse coding to enhance synchrotron radiation microspectroscopy images. By reconstructing high-resolution images from multiple low-resolution ones, exposure time is minimized, reducing radiation effects, thermal drift, and sample degradation while preserving spatial resolution. Unlike deep learning-based superresolution methods, which overlook positional misalignment, our approach treats positional shifts as known control parameters, enhancing superresolution accuracy with a small, noisy dataset. Additionally, our sparse coding method learns an optimal dictionary tailored for nanostructure extraction, fine-tuning the SR process to the unique characteristics of the data, even with noise and limited samples. Applied to 3D nanoscale electron spectroscopy for chemical analysis (nano-ESCA) data, our method, utilizing a high-resolution dictionary learned from 3D nano-ESCA datasets, significantly improves image quality, preserving structural details. Unlike state-of-the-art deep learning techniques that require large datasets, our method excels with limited data, making it ideal for real-world scenarios with constrained sample sizes. High-resolution quality can be maintained while reducing the measurement time by over $$40\%$$ , highlighting the efficiency of our approach. The results underscore the potential of this superresolution technique to not only advance synchrotron radiation microspectroscopy but also to be adapted for other high-resolution imaging modalities, such as electron microscopy. This approach offers enhanced image quality, reduced exposure times, and improved interpretability of scientific data, making it a versatile tool for overcoming the challenges associated with radiation damage and sample degradation in nanoscale imaging. |
| Druh dokumentu: |
article |
| Popis súboru: |
electronic resource |
| Jazyk: |
English |
| ISSN: |
2731-9229 |
| Relation: |
https://doaj.org/toc/2731-9229 |
| DOI: |
10.1186/s11671-025-04291-x |
| Prístupová URL adresa: |
https://doaj.org/article/c0ef5eb6ee134bd79a11c03e2c2972f1 |
| Prístupové číslo: |
edsdoj.0ef5eb6ee134bd79a11c03e2c2972f1 |
| Databáza: |
Directory of Open Access Journals |