Author Correction: Quantitative material analysis using secondary electron energy spectromicroscopy (Scientific Reports, (2020), 10, 1, (22144), 10.1038/s41598-020-78973-0) - Han, W.; Zheng, M.; Banerjee, A.; Luo, Y. Z.; Shen, L.; Khursheed, A.; ELECTRICAL AND COMPUTER ENGINEERING; MECHANICAL ENGINEERING (Scopus OA2021, 2021)