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Complex Permittivity Measurement of Low-Loss Anisotropic Dielectric Materials at Hundreds of Megahertz

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Název: Complex Permittivity Measurement of Low-Loss Anisotropic Dielectric Materials at Hundreds of Megahertz
Autoři: Chuanlan Li, Changying Wu, Lifei Shen
Zdroj: Electronics, Vol 11, Iss 1769, p 1769 (2022)
Informace o vydavateli: MDPI AG
Rok vydání: 2022
Sbírka: Directory of Open Access Journals: DOAJ Articles
Témata: complex permittivity, anisotropic dielectric material, multi-mode, split rectangular cavity, hundreds of megahertz, Electronics, TK7800-8360
Popis: Resonant methods are well known for their accuracy in determining the complex permittivity of materials. However, to guarantee the accuracy, interference modes must be suppressed in the measurement band. In this paper, a multi-mode split rectangular cavity is designed and fabricated to measure low-loss anisotropic dielectric materials in the frequency range from 300 to 1000 MHz. Details of the cavity design are presented. Simulation results for a uniaxially anisotropic material validate both the setup and the processing. Moreover, validation measurements on a sheet of polytetrafluoroethylene (PTFE) are in agreement with the literature data, which indicate that the proposed method in this paper is reliable and accurate for low-loss complex permittivity characterization at hundreds of megahertz.
Druh dokumentu: article in journal/newspaper
Jazyk: English
Relation: https://www.mdpi.com/2079-9292/11/11/1769; https://doaj.org/toc/2079-9292; https://doaj.org/article/49f0093c21484556b5c9f4b5230517ab
DOI: 10.3390/electronics11111769
Dostupnost: https://doi.org/10.3390/electronics11111769
https://doaj.org/article/49f0093c21484556b5c9f4b5230517ab
Přístupové číslo: edsbas.5B4337EB
Databáze: BASE
Popis
Abstrakt:Resonant methods are well known for their accuracy in determining the complex permittivity of materials. However, to guarantee the accuracy, interference modes must be suppressed in the measurement band. In this paper, a multi-mode split rectangular cavity is designed and fabricated to measure low-loss anisotropic dielectric materials in the frequency range from 300 to 1000 MHz. Details of the cavity design are presented. Simulation results for a uniaxially anisotropic material validate both the setup and the processing. Moreover, validation measurements on a sheet of polytetrafluoroethylene (PTFE) are in agreement with the literature data, which indicate that the proposed method in this paper is reliable and accurate for low-loss complex permittivity characterization at hundreds of megahertz.
DOI:10.3390/electronics11111769