Complex Permittivity Measurement of Low-Loss Anisotropic Dielectric Materials at Hundreds of Megahertz

Uloženo v:
Podrobná bibliografie
Název: Complex Permittivity Measurement of Low-Loss Anisotropic Dielectric Materials at Hundreds of Megahertz
Autoři: Chuanlan Li, Changying Wu, Lifei Shen
Zdroj: Electronics, Vol 11, Iss 1769, p 1769 (2022)
Informace o vydavateli: MDPI AG
Rok vydání: 2022
Sbírka: Directory of Open Access Journals: DOAJ Articles
Témata: complex permittivity, anisotropic dielectric material, multi-mode, split rectangular cavity, hundreds of megahertz, Electronics, TK7800-8360
Popis: Resonant methods are well known for their accuracy in determining the complex permittivity of materials. However, to guarantee the accuracy, interference modes must be suppressed in the measurement band. In this paper, a multi-mode split rectangular cavity is designed and fabricated to measure low-loss anisotropic dielectric materials in the frequency range from 300 to 1000 MHz. Details of the cavity design are presented. Simulation results for a uniaxially anisotropic material validate both the setup and the processing. Moreover, validation measurements on a sheet of polytetrafluoroethylene (PTFE) are in agreement with the literature data, which indicate that the proposed method in this paper is reliable and accurate for low-loss complex permittivity characterization at hundreds of megahertz.
Druh dokumentu: article in journal/newspaper
Jazyk: English
Relation: https://www.mdpi.com/2079-9292/11/11/1769; https://doaj.org/toc/2079-9292; https://doaj.org/article/49f0093c21484556b5c9f4b5230517ab
DOI: 10.3390/electronics11111769
Dostupnost: https://doi.org/10.3390/electronics11111769
https://doaj.org/article/49f0093c21484556b5c9f4b5230517ab
Přístupové číslo: edsbas.5B4337EB
Databáze: BASE
FullText Text:
  Availability: 0
CustomLinks:
  – Url: https://doi.org/10.3390/electronics11111769#
    Name: EDS - BASE (s4221598)
    Category: fullText
    Text: View record from BASE
  – Url: https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=EBSCO&SrcAuth=EBSCO&DestApp=WOS&ServiceName=TransferToWoS&DestLinkType=GeneralSearchSummary&Func=Links&author=Li%20C
    Name: ISI
    Category: fullText
    Text: Nájsť tento článok vo Web of Science
    Icon: https://imagesrvr.epnet.com/ls/20docs.gif
    MouseOverText: Nájsť tento článok vo Web of Science
Header DbId: edsbas
DbLabel: BASE
An: edsbas.5B4337EB
RelevancyScore: 925
AccessLevel: 3
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 925.000732421875
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Complex Permittivity Measurement of Low-Loss Anisotropic Dielectric Materials at Hundreds of Megahertz
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Chuanlan+Li%22">Chuanlan Li</searchLink><br /><searchLink fieldCode="AR" term="%22Changying+Wu%22">Changying Wu</searchLink><br /><searchLink fieldCode="AR" term="%22Lifei+Shen%22">Lifei Shen</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: Electronics, Vol 11, Iss 1769, p 1769 (2022)
– Name: Publisher
  Label: Publisher Information
  Group: PubInfo
  Data: MDPI AG
– Name: DatePubCY
  Label: Publication Year
  Group: Date
  Data: 2022
– Name: Subset
  Label: Collection
  Group: HoldingsInfo
  Data: Directory of Open Access Journals: DOAJ Articles
– Name: Subject
  Label: Subject Terms
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22complex+permittivity%22">complex permittivity</searchLink><br /><searchLink fieldCode="DE" term="%22anisotropic+dielectric+material%22">anisotropic dielectric material</searchLink><br /><searchLink fieldCode="DE" term="%22multi-mode%22">multi-mode</searchLink><br /><searchLink fieldCode="DE" term="%22split+rectangular+cavity%22">split rectangular cavity</searchLink><br /><searchLink fieldCode="DE" term="%22hundreds+of+megahertz%22">hundreds of megahertz</searchLink><br /><searchLink fieldCode="DE" term="%22Electronics%22">Electronics</searchLink><br /><searchLink fieldCode="DE" term="%22TK7800-8360%22">TK7800-8360</searchLink>
– Name: Abstract
  Label: Description
  Group: Ab
  Data: Resonant methods are well known for their accuracy in determining the complex permittivity of materials. However, to guarantee the accuracy, interference modes must be suppressed in the measurement band. In this paper, a multi-mode split rectangular cavity is designed and fabricated to measure low-loss anisotropic dielectric materials in the frequency range from 300 to 1000 MHz. Details of the cavity design are presented. Simulation results for a uniaxially anisotropic material validate both the setup and the processing. Moreover, validation measurements on a sheet of polytetrafluoroethylene (PTFE) are in agreement with the literature data, which indicate that the proposed method in this paper is reliable and accurate for low-loss complex permittivity characterization at hundreds of megahertz.
– Name: TypeDocument
  Label: Document Type
  Group: TypDoc
  Data: article in journal/newspaper
– Name: Language
  Label: Language
  Group: Lang
  Data: English
– Name: NoteTitleSource
  Label: Relation
  Group: SrcInfo
  Data: https://www.mdpi.com/2079-9292/11/11/1769; https://doaj.org/toc/2079-9292; https://doaj.org/article/49f0093c21484556b5c9f4b5230517ab
– Name: DOI
  Label: DOI
  Group: ID
  Data: 10.3390/electronics11111769
– Name: URL
  Label: Availability
  Group: URL
  Data: https://doi.org/10.3390/electronics11111769<br />https://doaj.org/article/49f0093c21484556b5c9f4b5230517ab
– Name: AN
  Label: Accession Number
  Group: ID
  Data: edsbas.5B4337EB
PLink https://erproxy.cvtisr.sk/sfx/access?url=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=edsbas&AN=edsbas.5B4337EB
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.3390/electronics11111769
    Languages:
      – Text: English
    Subjects:
      – SubjectFull: complex permittivity
        Type: general
      – SubjectFull: anisotropic dielectric material
        Type: general
      – SubjectFull: multi-mode
        Type: general
      – SubjectFull: split rectangular cavity
        Type: general
      – SubjectFull: hundreds of megahertz
        Type: general
      – SubjectFull: Electronics
        Type: general
      – SubjectFull: TK7800-8360
        Type: general
    Titles:
      – TitleFull: Complex Permittivity Measurement of Low-Loss Anisotropic Dielectric Materials at Hundreds of Megahertz
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Chuanlan Li
      – PersonEntity:
          Name:
            NameFull: Changying Wu
      – PersonEntity:
          Name:
            NameFull: Lifei Shen
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 01
              Type: published
              Y: 2022
          Identifiers:
            – Type: issn-locals
              Value: edsbas
            – Type: issn-locals
              Value: edsbas.oa
          Titles:
            – TitleFull: Electronics, Vol 11, Iss 1769, p 1769 (2022
              Type: main
ResultId 1