Li, C., Wu, C., & Shen, L. (2022). Complex Permittivity Measurement of Low-Loss Anisotropic Dielectric Materials at Hundreds of Megahertz. Electronics, Vol 11, Iss 1769, p 1769 (2022. https://doi.org/10.3390/electronics11111769
Citace podle Chicago (17th ed.)Li, Chuanlan, Changying Wu, a Lifei Shen. "Complex Permittivity Measurement of Low-Loss Anisotropic Dielectric Materials at Hundreds of Megahertz." Electronics, Vol 11, Iss 1769, P 1769 (2022 2022. https://doi.org/10.3390/electronics11111769.
Citace podle MLA (9th ed.)Li, Chuanlan, et al. "Complex Permittivity Measurement of Low-Loss Anisotropic Dielectric Materials at Hundreds of Megahertz." Electronics, Vol 11, Iss 1769, P 1769 (2022, 2022, https://doi.org/10.3390/electronics11111769.
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