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Degradation of electroplated silver coatings under the influence of an electric arc

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Bibliographic Details
Title: Degradation of electroplated silver coatings under the influence of an electric arc
Authors: Karwat, C., Kolasik, M., Kozar, C., Zukowski, P., Luhin, V. G., Zharsky, I. M.
Publisher Information: 2025.
Publication Year: 2025
Subject Terms: degradation of galvanic coatings, galvanic silver plating, деградация гальванических покрытий, гальваническое серебрение, сканирующая электронная микроскопия, X-ray microanalysis, scanning electron microscopy, рентгеноструктурный микроанализ
Description: Protective coatings of silver or less often of gold, platinum or palladium are applied to reduce effects of the arc action on contact surfaces. Their application involves a problem of selecting optimal coating thickness for that would be adequate for operating conditions of the switches and most of all for the cut-off current intensity. A method of scanning electron microscopy together with an x-ray microanalysis has been applied to investigate into degradation processes of protective silver coatings. Tests have been performed by Scanning Electron Microscope JSM-5610 LV with Energy Dispersive X-ray Spectrometer JED-2201 (JEOL, Japan).
Document Type: Article
File Description: application/pdf
Language: English
Access URL: https://elib.belstu.by/handle/123456789/70330
Accession Number: edsair.od......3992..c841bd16503d527f4e8689d229475369
Database: OpenAIRE
Description
Abstract:Protective coatings of silver or less often of gold, platinum or palladium are applied to reduce effects of the arc action on contact surfaces. Their application involves a problem of selecting optimal coating thickness for that would be adequate for operating conditions of the switches and most of all for the cut-off current intensity. A method of scanning electron microscopy together with an x-ray microanalysis has been applied to investigate into degradation processes of protective silver coatings. Tests have been performed by Scanning Electron Microscope JSM-5610 LV with Energy Dispersive X-ray Spectrometer JED-2201 (JEOL, Japan).