Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing

Saved in:
Bibliographic Details
Title: Very-High-Energy Heavy Ion Beam Dosimetry Using Solid State Detectors for Electronics Testing
Authors: Waets, Andreas, Bilko, Kacper, Coronetti, Andrea, Emriskova, Natalia, Barbero, Mario Sacristan, Alía, Rubén García, Durante, Marco, Schuy, Christoph, Wagner, Tim, Esposito, Luigi Salvatore, Nieminen, Petteri, Schneider, Uwe
Contributors: University of Zurich, Waets, Andreas, CERN Genève, Laboratoire Hubert Curien (LabHC), Institut d'Optique Graduate School (IOGS)-Université Jean Monnet - Saint-Étienne (UJM)-Centre National de la Recherche Scientifique (CNRS), GSI Helmholtzzentrum für Schwerionenforschung (GSI), European Space Research and Technology Centre (ESTEC), Agence Spatiale Européenne = European Space Agency (ESA), Universität Zürich Zürich = University of Zurich (UZH)
Source: IEEE transactions on nuclear science 71(8), 1837-1845 (2024). doi:10.1109/TNS.2024.3350667
Publisher Information: Institute of Electrical and Electronics Engineers (IEEE), 2024.
Publication Year: 2024
Subject Terms: [SPI]Engineering Sciences [physics], 530 Physics, 2208 Electrical and Electronic Engineering, 0103 physical sciences, 10192 Physics Institute, 3106 Nuclear and High Energy Physics, 01 natural sciences, 2104 Nuclear Energy and Engineering
Description: IEEE transactions on nuclear science 71(8), 1837 - 1845 (2024). doi:10.1109/TNS.2024.3350667
Published by IEEE, New York, NY
Document Type: Article
Other literature type
File Description: ZORA_10384650.pdf - application/pdf
ISSN: 1558-1578
0018-9499
DOI: 10.1109/tns.2024.3350667
DOI: 10.5167/uzh-269631
DOI: 10.15120/gsi-2024-00797
Access URL: https://repository.gsi.de/record/353132
https://www.zora.uzh.ch/id/eprint/269631/
https://doi.org/10.5167/uzh-269631
Rights: CC BY
Accession Number: edsair.doi.dedup.....fe7f5ef2b11f858f0947e90e6f1f3f90
Database: OpenAIRE
Description
Abstract:IEEE transactions on nuclear science 71(8), 1837 - 1845 (2024). doi:10.1109/TNS.2024.3350667<br />Published by IEEE, New York, NY
ISSN:15581578
00189499
DOI:10.1109/tns.2024.3350667