A Scan Slice Reordering Algorithm Based on Minimizing Entropy to Enhance Test Data Compression Efficiency

Gespeichert in:
Bibliographische Detailangaben
Titel: A Scan Slice Reordering Algorithm Based on Minimizing Entropy to Enhance Test Data Compression Efficiency
Autoren: Minghe Zhang, Guanglun Huang, Guoliang Ji, Zhiqiang You, Qiang Wu, Jianyu Cao
Quelle: 2024 IEEE International Test Conference in Asia (ITC-Asia). :1-6
Verlagsinformationen: IEEE, 2024.
Publikationsjahr: 2024
Publikationsart: Article
DOI: 10.1109/itc-asia62534.2024.10661362
Rights: STM Policy #29
Dokumentencode: edsair.doi...........ea33cca331e45b9099fa8d77c6ffabfa
Datenbank: OpenAIRE