APA (7th ed.) Citation

Zhang, M., Huang, G., Ji, G., You, Z., Wu, Q., & Cao, J. (2024). A Scan Slice Reordering Algorithm Based on Minimizing Entropy to Enhance Test Data Compression Efficiency. 2024 IEEE International Test Conference in Asia (ITC-Asia), 1. https://doi.org/10.1109/itc-asia62534.2024.10661362

Chicago Style (17th ed.) Citation

Zhang, Minghe, Guanglun Huang, Guoliang Ji, Zhiqiang You, Qiang Wu, and Jianyu Cao. "A Scan Slice Reordering Algorithm Based on Minimizing Entropy to Enhance Test Data Compression Efficiency." 2024 IEEE International Test Conference in Asia (ITC-Asia) 2024: 1. https://doi.org/10.1109/itc-asia62534.2024.10661362.

MLA (9th ed.) Citation

Zhang, Minghe, et al. "A Scan Slice Reordering Algorithm Based on Minimizing Entropy to Enhance Test Data Compression Efficiency." 2024 IEEE International Test Conference in Asia (ITC-Asia), 2024, p. 1, https://doi.org/10.1109/itc-asia62534.2024.10661362.