An industrial process fault diagnosis method based on independent slow feature analysis and stacked sparse autoencoder network

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Titel: An industrial process fault diagnosis method based on independent slow feature analysis and stacked sparse autoencoder network
Autoren: Chang Li, Chenglin Wen, Zhe Zhou
Quelle: Journal of the Franklin Institute. 361:234-247
Verlagsinformationen: Elsevier BV, 2024.
Publikationsjahr: 2024
Publikationsart: Article
Sprache: English
ISSN: 0016-0032
DOI: 10.1016/j.jfranklin.2023.10.004
Rights: Elsevier TDM
Dokumentencode: edsair.doi...........b09d2b146cef30ae9c1fec96df9ddccc
Datenbank: OpenAIRE