Li, C., Wen, C., & Zhou, Z. (2024). An industrial process fault diagnosis method based on independent slow feature analysis and stacked sparse autoencoder network. Journal of the Franklin Institute, 361, 234-247. https://doi.org/10.1016/j.jfranklin.2023.10.004
Chicago Style (17th ed.) CitationLi, Chang, Chenglin Wen, and Zhe Zhou. "An Industrial Process Fault Diagnosis Method Based on Independent Slow Feature Analysis and Stacked Sparse Autoencoder Network." Journal of the Franklin Institute 361 (2024): 234-247. https://doi.org/10.1016/j.jfranklin.2023.10.004.
MLA (9th ed.) CitationLi, Chang, et al. "An Industrial Process Fault Diagnosis Method Based on Independent Slow Feature Analysis and Stacked Sparse Autoencoder Network." Journal of the Franklin Institute, vol. 361, 2024, pp. 234-247, https://doi.org/10.1016/j.jfranklin.2023.10.004.