Cost-Optimized Double-Node-Upset-Recovery Latch Designs With Aging Mitigation and Algorithm-Based Verification for Long-Term Robustness Enhancement - Aibin Yan; Changli Hu; Jing Li; Na Bai; Zhengfeng Huang; Tianming Ni; Girard Patrick; Xiaoqing Wen (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2025)