APA (7th ed.) Citation

Liu, Q., Zhao, L., Hou, Z., Hao, J., Li, X., Zhao, Y., . . . Zhang, J. (2023). Integrated Circuit Wafer Detection Based on Intelligent Information Processing. 2023 IEEE 3rd International Conference on Computer Systems (ICCS), 183. https://doi.org/10.1109/iccs59700.2023.10335523

Chicago Style (17th ed.) Citation

Liu, Qing, Limin Zhao, Zhe Hou, Jing Hao, Xiangbing Li, Yuxiang Zhao, Jinfang Yang, and Jinbing Zhang. "Integrated Circuit Wafer Detection Based on Intelligent Information Processing." 2023 IEEE 3rd International Conference on Computer Systems (ICCS) 2023: 183. https://doi.org/10.1109/iccs59700.2023.10335523.

MLA (9th ed.) Citation

Liu, Qing, et al. "Integrated Circuit Wafer Detection Based on Intelligent Information Processing." 2023 IEEE 3rd International Conference on Computer Systems (ICCS), 2023, p. 183, https://doi.org/10.1109/iccs59700.2023.10335523.