Baucom, G., Hershkovitz, E., Chojecki, P., Nishida, T., Tabrizian, R., & Kim, H. (2024). Nanoscale Phase and Orientation Mapping in Multiphase Polycrystalline Hafnium Zirconium Oxide Thin Films Using 4D‐STEM and Automated Diffraction Indexing. Small Methods, 8(12), 1. https://doi.org/10.1002/smtd.202400395
Citace podle Chicago (17th ed.)Baucom, Garrett, Eitan Hershkovitz, Paul Chojecki, Toshikazu Nishida, Roozbeh Tabrizian, a Honggyu Kim. "Nanoscale Phase and Orientation Mapping in Multiphase Polycrystalline Hafnium Zirconium Oxide Thin Films Using 4D‐STEM and Automated Diffraction Indexing." Small Methods 8, no. 12 (2024): 1. https://doi.org/10.1002/smtd.202400395.
Citace podle MLA (9th ed.)Baucom, Garrett, et al. "Nanoscale Phase and Orientation Mapping in Multiphase Polycrystalline Hafnium Zirconium Oxide Thin Films Using 4D‐STEM and Automated Diffraction Indexing." Small Methods, vol. 8, no. 12, 2024, p. 1, https://doi.org/10.1002/smtd.202400395.