Timing-sequence testing of parallel programs.

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Title: Timing-sequence testing of parallel programs.
Authors: Liang, Yu, Li, Shu, Zhang, Hui, Han, Chengde
Source: Journal of Computer Science & Technology (10009000); Jan2000, Vol. 15 Issue 1, p84-95, 12p
Abstract: Testing of parallel programs involves two parts—testing of control-flow within the processes and testing of timing-sequence. This paper focuses on the latter, particularly on the timing-sequence of message-passing paradigms. Firstly the coarse-grained SYN-sequence model is built up to describe the execution of distributed programs. All of the topics discussed in this paper are based on it. The most direct way to test a program is to run it. A fault-free parallel program should be of both correct computing results and proper SYN-sequence. In order to analyze the validity of observed SYN-sequence, this paper presents the formal specification (Backus Normal Form) of the valid SYN-sequence. Till now there is little work about the testing coverage for distributed programs. Calculating the number of the valid SYN-sequences is the key to coverage problem, while the number of the valid SYN-sequences is terribly large and it is very hard to obtain the combination law among SYN-events. In order to resolve this problem, this paper proposes an efficient testing strategy—atomic SYN-event testing, which is to linearize the SYN-sequence (making it only consist of serial atomic SYN-events) first and then test each atomic SYN-event independently. This paper particularly provides the calculating formula about the number of the valid SYN-sequences for tree-topology atomic SYN-event (broadcast and combine). Furthermore, the number of valid SYN-sequences also, to some degree, mirrors the testability of parallel programs. Taking tree-topology atomic SYN-event as an example, this paper demonstrates the testability and communication speed of the tree-topology atomic SYN-event under different numbers of branches in order to achieve a more satisfactory tradeoff between testability and communication efficiency. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Computer Science & Technology (10009000) is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Timing-sequence testing of parallel programs.
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  Data: <searchLink fieldCode="AR" term="%22Liang%2C+Yu%22">Liang, Yu</searchLink><br /><searchLink fieldCode="AR" term="%22Li%2C+Shu%22">Li, Shu</searchLink><br /><searchLink fieldCode="AR" term="%22Zhang%2C+Hui%22">Zhang, Hui</searchLink><br /><searchLink fieldCode="AR" term="%22Han%2C+Chengde%22">Han, Chengde</searchLink>
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  Data: Journal of Computer Science & Technology (10009000); Jan2000, Vol. 15 Issue 1, p84-95, 12p
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Testing of parallel programs involves two parts—testing of control-flow within the processes and testing of timing-sequence. This paper focuses on the latter, particularly on the timing-sequence of message-passing paradigms. Firstly the coarse-grained SYN-sequence model is built up to describe the execution of distributed programs. All of the topics discussed in this paper are based on it. The most direct way to test a program is to run it. A fault-free parallel program should be of both correct computing results and proper SYN-sequence. In order to analyze the validity of observed SYN-sequence, this paper presents the formal specification (Backus Normal Form) of the valid SYN-sequence. Till now there is little work about the testing coverage for distributed programs. Calculating the number of the valid SYN-sequences is the key to coverage problem, while the number of the valid SYN-sequences is terribly large and it is very hard to obtain the combination law among SYN-events. In order to resolve this problem, this paper proposes an efficient testing strategy—atomic SYN-event testing, which is to linearize the SYN-sequence (making it only consist of serial atomic SYN-events) first and then test each atomic SYN-event independently. This paper particularly provides the calculating formula about the number of the valid SYN-sequences for tree-topology atomic SYN-event (broadcast and combine). Furthermore, the number of valid SYN-sequences also, to some degree, mirrors the testability of parallel programs. Taking tree-topology atomic SYN-event as an example, this paper demonstrates the testability and communication speed of the tree-topology atomic SYN-event under different numbers of branches in order to achieve a more satisfactory tradeoff between testability and communication efficiency. [ABSTRACT FROM AUTHOR]
– Name: Abstract
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Computer Science & Technology (10009000) is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – Type: doi
        Value: 10.1007/BF02951930
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      – Code: eng
        Text: English
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        PageCount: 12
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      – TitleFull: Timing-sequence testing of parallel programs.
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            NameFull: Liang, Yu
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            NameFull: Li, Shu
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            NameFull: Zhang, Hui
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            NameFull: Han, Chengde
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            – D: 01
              M: 01
              Text: Jan2000
              Type: published
              Y: 2000
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