Ivanyuk, A., & Yarmolik, V. (2008). A new approach to the design of built-in internal memory self-testing devices. Automatic Control & Computer Sciences, 42(4), 169-174. https://doi.org/10.3103/S0146411608040019
Citácia podle Chicago (17th ed.)Ivanyuk, A., a V. Yarmolik. "A New Approach to the Design of Built-in Internal Memory Self-testing Devices." Automatic Control & Computer Sciences 42, no. 4 (2008): 169-174. https://doi.org/10.3103/S0146411608040019.
Citácia podľa MLA (8th ed.)Ivanyuk, A., a V. Yarmolik. "A New Approach to the Design of Built-in Internal Memory Self-testing Devices." Automatic Control & Computer Sciences, vol. 42, no. 4, 2008, pp. 169-174, https://doi.org/10.3103/S0146411608040019.
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