APA (7th ed.) Citation

Devi, M. C., & Rajkumar, T. D. (2025). A novel attention based deep learning model for software defect prediction with bidirectional word embedding system. Soft Computing - A Fusion of Foundations, Methodologies & Applications, 29(4), 2171-2188. https://doi.org/10.1007/s00500-025-10475-5

Chicago Style (17th ed.) Citation

Devi, M. Chitra, and T. Dhiliphan Rajkumar. "A Novel Attention Based Deep Learning Model for Software Defect Prediction with Bidirectional Word Embedding System." Soft Computing - A Fusion of Foundations, Methodologies & Applications 29, no. 4 (2025): 2171-2188. https://doi.org/10.1007/s00500-025-10475-5.

MLA (9th ed.) Citation

Devi, M. Chitra, and T. Dhiliphan Rajkumar. "A Novel Attention Based Deep Learning Model for Software Defect Prediction with Bidirectional Word Embedding System." Soft Computing - A Fusion of Foundations, Methodologies & Applications, vol. 29, no. 4, 2025, pp. 2171-2188, https://doi.org/10.1007/s00500-025-10475-5.