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Symmetries in transmission electron microscopy imaging of crystals with strain.

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Názov: Symmetries in transmission electron microscopy imaging of crystals with strain.
Autori: Koprucki, Thomas, Maltsi, Anieza, Mielke, Alexander
Zdroj: Proceedings of the Royal Society A: Mathematical, Physical & Engineering Sciences; Nov2022, Vol. 478 Issue 2267, p1-23, 23p
Predmety: TRANSMISSION electron microscopy, QUANTUM dots, SYMMETRY, CRYSTALS
Abstrakt: Transmission electron microscopy (TEM) images of strained crystals often exhibit symmetries, the source of which is not always clear. To understand these symmetries, we distinguish between symmetries that occur from the imaging process itself and symmetries of the inclusion that might affect the image. For the imaging process, we prove mathematically that the intensities are invariant under specific transformations. A combination of these invariances with specific properties of the strain profile can then explain symmetries observed in TEM images. We demonstrate our approach to the study of symmetries in TEM images using selected examples in the field of semiconductor nanostructures such as quantum wells and quantum dots. [ABSTRACT FROM AUTHOR]
Copyright of Proceedings of the Royal Society A: Mathematical, Physical & Engineering Sciences is the property of Royal Society and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Label: Title
  Group: Ti
  Data: Symmetries in transmission electron microscopy imaging of crystals with strain.
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  Data: <searchLink fieldCode="AR" term="%22Koprucki%2C+Thomas%22">Koprucki, Thomas</searchLink><br /><searchLink fieldCode="AR" term="%22Maltsi%2C+Anieza%22">Maltsi, Anieza</searchLink><br /><searchLink fieldCode="AR" term="%22Mielke%2C+Alexander%22">Mielke, Alexander</searchLink>
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  Data: Proceedings of the Royal Society A: Mathematical, Physical & Engineering Sciences; Nov2022, Vol. 478 Issue 2267, p1-23, 23p
– Name: Subject
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  Data: <searchLink fieldCode="DE" term="%22TRANSMISSION+electron+microscopy%22">TRANSMISSION electron microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22QUANTUM+dots%22">QUANTUM dots</searchLink><br /><searchLink fieldCode="DE" term="%22SYMMETRY%22">SYMMETRY</searchLink><br /><searchLink fieldCode="DE" term="%22CRYSTALS%22">CRYSTALS</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Transmission electron microscopy (TEM) images of strained crystals often exhibit symmetries, the source of which is not always clear. To understand these symmetries, we distinguish between symmetries that occur from the imaging process itself and symmetries of the inclusion that might affect the image. For the imaging process, we prove mathematically that the intensities are invariant under specific transformations. A combination of these invariances with specific properties of the strain profile can then explain symmetries observed in TEM images. We demonstrate our approach to the study of symmetries in TEM images using selected examples in the field of semiconductor nanostructures such as quantum wells and quantum dots. [ABSTRACT FROM AUTHOR]
– Name: Abstract
  Label:
  Group: Ab
  Data: <i>Copyright of Proceedings of the Royal Society A: Mathematical, Physical & Engineering Sciences is the property of Royal Society and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1098/rspa.2022.0317
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      – Code: eng
        Text: English
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        PageCount: 23
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      – SubjectFull: TRANSMISSION electron microscopy
        Type: general
      – SubjectFull: QUANTUM dots
        Type: general
      – SubjectFull: SYMMETRY
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      – SubjectFull: CRYSTALS
        Type: general
    Titles:
      – TitleFull: Symmetries in transmission electron microscopy imaging of crystals with strain.
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            NameFull: Koprucki, Thomas
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            – D: 01
              M: 11
              Text: Nov2022
              Type: published
              Y: 2022
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              Value: 2267
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            – TitleFull: Proceedings of the Royal Society A: Mathematical, Physical & Engineering Sciences
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