Auber--Le Saux, J., Detalle, V., Bai, X., Andrianakis, M., Wilkie-Chancellier, N., & Tornari, V. (2022). Surface Displacement Measurements of Artworks: New Data Processing for Speckle Pattern Interferometry. Applied Sciences (2076-3417), 12(23), 11969-11986. https://doi.org/10.3390/app122311969
Citace podle Chicago (17th ed.)Auber--Le Saux, Jessica, Vincent Detalle, Xueshi Bai, Michalis Andrianakis, Nicolas Wilkie-Chancellier, a Vivi Tornari. "Surface Displacement Measurements of Artworks: New Data Processing for Speckle Pattern Interferometry." Applied Sciences (2076-3417) 12, no. 23 (2022): 11969-11986. https://doi.org/10.3390/app122311969.
Citace podle MLA (9th ed.)Auber--Le Saux, Jessica, et al. "Surface Displacement Measurements of Artworks: New Data Processing for Speckle Pattern Interferometry." Applied Sciences (2076-3417), vol. 12, no. 23, 2022, pp. 11969-11986, https://doi.org/10.3390/app122311969.