Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration.

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Bibliographic Details
Title: Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration.
Authors: Son, Seong-Ho, Park, Won-Kwang
Source: Electronics (2079-9292); Oct2022, Vol. 11 Issue 19, p3054, 13p
Subject Terms: BESSEL functions, INTEGRAL functions, INTEGRAL equations, INTEGERS
Abstract: We develop a sampling-type algorithm for localizing a small object from scattering parameter data measured in a bistatic configuration. To this end, we design a sampling-type imaging function based on the integral equation formula for the scattering parameter. To clarify its applicability, we show that the imaging function can be expressed by the bistatic angle, antenna arrangement, and Bessel function of an integer order. This result reveals some properties of the imaging function and influence of the selection of the bistatic angle. Numerical experiments are carried out for single and multiple small and large objectives to illustrate the pros and cons of the developed algorithm. [ABSTRACT FROM AUTHOR]
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Database: Complementary Index
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