Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration.
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| Title: | Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration. |
|---|---|
| Authors: | Son, Seong-Ho, Park, Won-Kwang |
| Source: | Electronics (2079-9292); Oct2022, Vol. 11 Issue 19, p3054, 13p |
| Subject Terms: | BESSEL functions, INTEGRAL functions, INTEGRAL equations, INTEGERS |
| Abstract: | We develop a sampling-type algorithm for localizing a small object from scattering parameter data measured in a bistatic configuration. To this end, we design a sampling-type imaging function based on the integral equation formula for the scattering parameter. To clarify its applicability, we show that the imaging function can be expressed by the bistatic angle, antenna arrangement, and Bessel function of an integer order. This result reveals some properties of the imaging function and influence of the selection of the bistatic angle. Numerical experiments are carried out for single and multiple small and large objectives to illustrate the pros and cons of the developed algorithm. [ABSTRACT FROM AUTHOR] |
| Copyright of Electronics (2079-9292) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Complementary Index |
| FullText | Text: Availability: 0 CustomLinks: – Url: https://resolver.ebscohost.com/openurl?sid=EBSCO:edb&genre=article&issn=20799292&ISBN=&volume=11&issue=19&date=20221001&spage=3054&pages=3054-3066&title=Electronics (2079-9292)&atitle=Localization%20of%20Small%20Objectives%20from%20Scattering%20Parameter%20via%20Bistatic%20Measurement%20Configuration.&aulast=Son%2C%20Seong-Ho&id=DOI:10.3390/electronics11193054 Name: Full Text Finder Category: fullText Text: Full Text Finder Icon: https://imageserver.ebscohost.com/branding/images/FTF.gif MouseOverText: Full Text Finder – Url: https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=EBSCO&SrcAuth=EBSCO&DestApp=WOS&ServiceName=TransferToWoS&DestLinkType=GeneralSearchSummary&Func=Links&author=Son%20S Name: ISI Category: fullText Text: Nájsť tento článok vo Web of Science Icon: https://imagesrvr.epnet.com/ls/20docs.gif MouseOverText: Nájsť tento článok vo Web of Science |
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| Header | DbId: edb DbLabel: Complementary Index An: 159673534 RelevancyScore: 932 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 931.684814453125 |
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| Items | – Name: Title Label: Title Group: Ti Data: Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Son%2C+Seong-Ho%22">Son, Seong-Ho</searchLink><br /><searchLink fieldCode="AR" term="%22Park%2C+Won-Kwang%22">Park, Won-Kwang</searchLink> – Name: TitleSource Label: Source Group: Src Data: Electronics (2079-9292); Oct2022, Vol. 11 Issue 19, p3054, 13p – Name: Subject Label: Subject Terms Group: Su Data: <searchLink fieldCode="DE" term="%22BESSEL+functions%22">BESSEL functions</searchLink><br /><searchLink fieldCode="DE" term="%22INTEGRAL+functions%22">INTEGRAL functions</searchLink><br /><searchLink fieldCode="DE" term="%22INTEGRAL+equations%22">INTEGRAL equations</searchLink><br /><searchLink fieldCode="DE" term="%22INTEGERS%22">INTEGERS</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: We develop a sampling-type algorithm for localizing a small object from scattering parameter data measured in a bistatic configuration. To this end, we design a sampling-type imaging function based on the integral equation formula for the scattering parameter. To clarify its applicability, we show that the imaging function can be expressed by the bistatic angle, antenna arrangement, and Bessel function of an integer order. This result reveals some properties of the imaging function and influence of the selection of the bistatic angle. Numerical experiments are carried out for single and multiple small and large objectives to illustrate the pros and cons of the developed algorithm. [ABSTRACT FROM AUTHOR] – Name: Abstract Label: Group: Ab Data: <i>Copyright of Electronics (2079-9292) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/electronics11193054 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 3054 Subjects: – SubjectFull: BESSEL functions Type: general – SubjectFull: INTEGRAL functions Type: general – SubjectFull: INTEGRAL equations Type: general – SubjectFull: INTEGERS Type: general Titles: – TitleFull: Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Son, Seong-Ho – PersonEntity: Name: NameFull: Park, Won-Kwang IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 10 Text: Oct2022 Type: published Y: 2022 Identifiers: – Type: issn-print Value: 20799292 Numbering: – Type: volume Value: 11 – Type: issue Value: 19 Titles: – TitleFull: Electronics (2079-9292) Type: main |
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