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Lambda Theta Reflectometry: A New Technique for Measuring Optical Film Thickness in Planar Protein Arrays.

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Titel:	Lambda Theta Reflectometry: A New Technique for Measuring Optical Film Thickness in Planar Protein Arrays.
Autoren:	Klose AM; Department of Dermatology, University of Rochester, Rochester, New York 14627, United States.; Materials Science Program, University of Rochester, Rochester, New York 14627, United States., Katz JD; Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14627, United States., Boni R; Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14627, United States., Nelson D; Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14627, United States., Hassard B; Institute of Optics, University of Rochester, Rochester, New York 14627, United States., Miller BL; Department of Dermatology, University of Rochester, Rochester, New York 14627, United States.; Materials Science Program, University of Rochester, Rochester, New York 14627, United States.; Department of Biomedical Engineering, University of Rochester, Rochester, New York 14627, United States.; Institute of Optics, University of Rochester, Rochester, New York 14627, United States.
Quelle:	ACS sensors [ACS Sens] 2025 Jul 25; Vol. 10 (7), pp. 5097-5107. Date of Electronic Publication: 2025 Jul 02.
Publikationsart:	Journal Article
Sprache:	English
Info zur Zeitschrift:	Publisher: American Chemical Society Country of Publication: United States NLM ID: 101669031 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2379-3694 (Electronic) Linking ISSN: 23793694 NLM ISO Abbreviation: ACS Sens Subsets: MEDLINE
Imprint Name(s):	Original Publication: Washington, DC : American Chemical Society, [2016]-
MeSH-Schlagworte:	Protein Array Analysis/methods , Protein Array Analysis/instrumentation , Biosensing Techniques*/methods, Silicon Dioxide/chemistry
Abstract:	Quantitative protein measurements provide valuable information about biological pathways, immune system functionality, and the mechanisms of disease. The most accurate methods for detecting proteins are label-free and preserve native protein-binding interactions. Label-free biomolecular interaction analysis includes reflectometry, a group of techniques that detect proteins by measuring the reflectance properties of a thin film on a substrate. Most of these techniques are limited in some way by instrument complexity, sensitivity, or consumable manufacturing requirements. To address these issues, we introduce Lambda Theta Reflectometry (LTR), a new reflectometric technique that measures changes in film thickness by determining the point of null reflectivity as a function of wavelength (lambda) and angle of incidence (theta). The substrate is simultaneously illuminated with a range of angles and wavelengths, and reflected light is resolved both angularly and spectrally. Our prototype LTR reflectometer can measure SiO 2 layer thickness with milli-Ångström precision. LTR measurements of Si/SiO 2 oxide films are in excellent agreement with spectroscopic ellipsometry for film thicknesses ranging from 1390 to 1465 Å. This technique enables label-free biosensing measurements across a range of biological analyte concentrations (0.5 ng/mL to μg/mL) without requiring stringent control over probe deposition thickness or substrate manufacturing.
Kommentare:	Update of: bioRxiv. 2025 Mar 29:2025.03.26.645463. doi: 10.1101/2025.03.26.645463.. (PMID: 40196501)
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Grant Information:	P50 AR072000 United States AR NIAMS NIH HHS
Contributed Indexing:	Keywords: immunoassay; optical thickness measurement; reflectometry; spectroscopy; thin film
Substance Nomenclature:	7631-86-9 (Silicon Dioxide)
Entry Date(s):	Date Created: 20250702 Date Completed: 20250725 Latest Revision: 20250801
Update Code:	20250801
PubMed Central ID:	PMC12305664
DOI:	10.1021/acssensors.5c01108
PMID:	40600954
Datenbank:	MEDLINE

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