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Diffraction by random Ronchi gratings.

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Název: Diffraction by random Ronchi gratings.
Autoři: Torcal-Milla FJ, Sanchez-Brea LM
Zdroj: Applied optics [Appl Opt] 2016 Aug 01; Vol. 55 (22), pp. 5855-9.
Způsob vydávání: Journal Article
Jazyk: English
Informace o časopise: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited Medium: Internet ISSN: 1539-4522 (Electronic) Linking ISSN: 1559128X NLM ISO Abbreviation: Appl Opt Subsets: PubMed not MEDLINE
Imprint Name(s): Publication: Washington, DC : Optica Publishing Group
Original Publication: Easton, Pa., Optical Society of America.
Abstrakt: In this work, we obtain analytical expressions for the near-and far-field diffraction of random Ronchi diffraction gratings where the slits of the grating are randomly displaced around their periodical positions. We theoretically show that the effect of randomness in the position of the slits of the grating produces a decrease of the contrast and even disappearance of the self-images for high randomness level at the near field. On the other hand, it cancels high-order harmonics in far field, resulting in only a few central diffraction orders. Numerical simulations by means of the Rayleigh-Sommerfeld diffraction formula are performed in order to corroborate the analytical results. These results are of interest for industrial and technological applications where manufacture errors need to be considered.
Entry Date(s): Date Created: 20160810 Date Completed: 20180129 Latest Revision: 20181023
Update Code: 20250114
DOI: 10.1364/AO.55.005855
PMID: 27505363
Databáze: MEDLINE
Popis
Abstrakt:In this work, we obtain analytical expressions for the near-and far-field diffraction of random Ronchi diffraction gratings where the slits of the grating are randomly displaced around their periodical positions. We theoretically show that the effect of randomness in the position of the slits of the grating produces a decrease of the contrast and even disappearance of the self-images for high randomness level at the near field. On the other hand, it cancels high-order harmonics in far field, resulting in only a few central diffraction orders. Numerical simulations by means of the Rayleigh-Sommerfeld diffraction formula are performed in order to corroborate the analytical results. These results are of interest for industrial and technological applications where manufacture errors need to be considered.
ISSN:1539-4522
DOI:10.1364/AO.55.005855