A Test Pattern Selection Method for a Joint Bounded-Distance and Encoding-Based Decoding Algorithm of Binary Codes.
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| Title: | A Test Pattern Selection Method for a Joint Bounded-Distance and Encoding-Based Decoding Algorithm of Binary Codes. |
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| Authors: | Tokushige, Hitoshi1,2 tokusige@is.tokushima-u.ac.jp, Fossorier, Marc P. C.3, Kasami, Tadao4 |
| Source: | IEEE Transactions on Communications. Jun2010, Vol. 58 Issue 6, p1601-1604. 4p. |
| Subject Terms: | *LINEAR systems, *NUMERICAL solutions to boundary value problems, *MATHEMATICAL sequences, *ALGORITHMS, *SIMULATION methods & models |
| Abstract: | For binary linear block codes, this letter deals with a class of decoding algorithms which utilize bounded-distance and encoding-based decodings with input sequences that are calculated from a received sequence and given test patterns. We propose a new method for selecting the test patterns by simulation. The effectiveness of the decoding algorithm whose test patterns are selected by the proposed method is also shown by simulation. [ABSTRACT FROM AUTHOR] |
| Database: | Academic Search Index |
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