Search Results - stacked sparse autoencoder((((ssage OR sage) OR sae) OR ssad))
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1
Authors: et al.
Source: Transactions on Emerging Telecommunications Technologies. 36
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2
Authors: et al.
Source: Scientific Reports; 10/21/2025, Vol. 15 Issue 1, p1-22, 22p
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3
Authors:
Source: Iran Journal of Computer Science; Dec2025, Vol. 8 Issue 4, p2175-2198, 24p
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4
Authors:
Source: Engineering, Technology & Applied Science Research; Aug2025, Vol. 15 Issue 4, p24436-24441, 6p
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5
Authors: et al.
Source: Engineering Reports; Sep2025, Vol. 7 Issue 9, p1-17, 17p
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6
Authors: et al.
Source: IEEE Access, Vol 5, Pp 15066-15079 (2017)
Subject Terms: Sparse autoencoder, ensemble empirical mode decomposition, autoregressive model, fault diagnosis, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
File Description: electronic resource
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7
Authors: et al.
Source: Discrete Dynamics in Nature and Society, Vol 2023 (2023)
Subject Terms: QA1-939, 0211 other engineering and technologies, 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, Mathematics
File Description: text/xhtml
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8
Authors:
Source: Sensors (14248220); Apr2025, Vol. 25 Issue 8, p2391, 14p
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9
Authors: et al.
Source: Oil Shale; 2025, Vol. 42 Issue 1, p79-114, 36p
Subject Terms: SHALE oils, SUPERVISED learning, PETROLEUM prospecting, AUTOENCODERS, MACHINE learning
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10
Authors:
Source: Journal of Intelligent Systems & Internet of Things; 2025, Vol. 14 Issue 2, p115-126, 12p
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11
Authors: et al.
Source: Vehicle System Dynamics; Feb2025, Vol. 63 Issue 2, p232-257, 26p
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12
Authors: et al.
Source: Tropical Animal Health & Production. Dec2025, Vol. 57 Issue 9, p1-9. 9p.
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13
Authors: et al.
Source: The Canadian Journal of Chemical Engineering. 101:5858-5873
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14
Authors: et al.
Source: Electric Power Components & Systems. 2023, Vol. 51 Issue 2, p113-130. 18p.
Subject Terms: *ELECTRIC lines, *ALGORITHMS, *DIGITAL computer simulation, *ELECTRIC fault location
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15
Authors: et al.
Source: Canadian Journal of Chemical Engineering; Oct2023, Vol. 101 Issue 10, p5858-5873, 16p
Subject Terms: LEAST squares, FEATURE extraction, MANUFACTURING processes, PRODUCT quality
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16
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Source: Processes; Apr2024, Vol. 12 Issue 4, p816, 19p
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17
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Source: Scientific Reports; 8/19/2025, Vol. 15 Issue 1, p1-17, 17p
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18
Authors:
Source: i-Manager's Journal on Computer Science; Sep2025, Vol. 13 Issue 2, p83-93, 11p
Subject Terms: LONG short-term memory, DEEP learning, DECISION making, METADATA, AIR warfare, ENSEMBLE learning, AUTONOMOUS robots
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19
Authors:
Source: 2020 39th Chinese Control Conference (CCC). :5922-5926
Subject Terms: 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology
Access URL: https://ieeexplore.ieee.org/document/9188550/
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20
Authors: et al.
Source: Sensor Review; 2025, Vol. 45 Issue 6, p846-856, 11p
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