Suchergebnisse - parallel OS-ELM algorithm
-
1
Autoren:
Quelle: Electric Power Components and Systems. 48:603-614
-
2
Autoren:
Quelle: Electric Power Components & Systems; 2020, Vol. 48 Issue 6/7, p603-614, 12p
-
3
Autoren: et al.
Quelle: Memetic Computing; Sep2017, Vol. 9 Issue 3, p183-197, 15p
-
4
Autoren: et al.
Quelle: Proceedings in Adaptation, Learning and Optimization ISBN: 9783319283968
-
5
Autoren: et al.
Quelle: Mathematical & Computational Applications; Jun2024, Vol. 29 Issue 3, p40, 33p
-
6
Autoren: et al.
Quelle: Machines; Aug2025, Vol. 13 Issue 8, p748, 21p
-
7
Autoren: et al.
Quelle: International Transactions on Electrical Energy Systems; 8/28/2022, p1-7, 7p
-
8
Autoren: et al.
Quelle: Journal of Nondestructive Evaluation; Dec2025, Vol. 44 Issue 4, p1-22, 22p
-
9
Autoren: et al.
Quelle: Sensors (14248220); Sep2025, Vol. 25 Issue 17, p5545, 24p
Schlagwörter: INDOOR positioning systems, GRAPH algorithms, DEEP learning, MICROSENSORS
-
10
Autoren: et al.
Quelle: Water (20734441); Jul2025, Vol. 17 Issue 13, p1850, 24p
-
11
Autoren:
Quelle: Concurrency & Computation: Practice & Experience; 7/10/2022, Vol. 34 Issue 15, p1-19, 19p
Schlagwörter: MACHINE learning, ONLINE education, SEQUENTIAL learning, GRAPHICS processing units
-
12
Autoren: et al.
Quelle: Proceedings of ELM-2015 Volume 1; 2016, p13-25, 13p
-
13
Autoren: et al.
Quelle: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Nov2019, Vol. 38 Issue 11, p2127-2138, 12p
-
14
Autoren: et al.
Resource Type: eBook.
Schlagworte: Parallel programming (Computer science)--Congresses, Parallel processing (Electronic computers)--Congresses
Categories: COMPUTERS / Computer Science
-
15
Autoren: et al.
Schlagwörter: Ciencias Informáticas, Parallel computing, High performance computing, Extreme learning machine, Fingerprint classification
Dateibeschreibung: application/pdf; 19-23
Verfügbarkeit: http://sedici.unlp.edu.ar/handle/10915/155423
-
16
Autoren: et al.
Quelle: Neurocomputing. Jan2016 Part A, Vol. 174, p352-367. 16p.
Schlagwörter: *PARALLEL computers, *SEQUENTIAL analysis, *MACHINE learning, *BIG data, *FAULT tolerance (Engineering), *ALGORITHMS
-
17
Autoren: et al.
Quelle: IEEE Transactions on Industry Applications; Mar/Apr2021, Vol. 57 Issue 2, p1860-1871, 12p
-
18
Autoren:
Quelle: International Journal of Machine Learning & Cybernetics; 2021, Vol. 12 Issue 1, p87-102, 16p
-
19
Autoren: et al.
Quelle: Sensors (14248220); 2015, Vol. 15 Issue 1, p1804-1824, 21p
-
20
Autoren:
Quelle: Electrical Engineering; Oct2024, Vol. 106 Issue 5, p5319-5337, 19p
Full Text Finder
Nájsť tento článok vo Web of Science