Suchergebnisse - feature-embedded stacked sparse autoencoder
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Autoren: et al.
Quelle: Applied Sciences, Vol 13, Iss 12, p 7322 (2023)
Schlagwörter: recognition of chronic disease, wearable sensor monitoring, sample-pair envelope concatenation, envelope learning, diamond-like feature learning, feature-embedded stacked sparse autoencoder, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999
Relation: https://www.mdpi.com/2076-3417/13/12/7322; https://doaj.org/toc/2076-3417; https://doaj.org/article/34e413f2a72d4928a8f395c07dad668e
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Autoren: et al.
Quelle: IEEE Access, Vol 9, Pp 28729-28741 (2021)
Schlagwörter: Embedded hybrid feature sparse stacked autoencoder, ensemble learning, feature fusion, L1 regularization, speech mental health recognition, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
Relation: https://ieeexplore.ieee.org/document/9348883/; https://doaj.org/toc/2169-3536; https://doaj.org/article/4e1029e37cad4c62884db95a4caa020b
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Autoren: et al.
Quelle: Applied Sciences (2076-3417); Jun2023, Vol. 13 Issue 12, p7322, 29p
Schlagwörter: CHRONIC diseases, WEARABLE technology, ALGORITHMS, HUMAN body, DIAMONDS, EARLY diagnosis, NANODIAMONDS
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Autoren: et al.
Quelle: Animal Genetics. Aug2024, Vol. 55 Issue 4, p599-611. 13p.
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Autoren: et al.
Quelle: International Journal of Medical Robotics & Computer Assisted Surgery; Dec2018, Vol. 14 Issue 6, pN.PAG-N.PAG, 1p
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Quelle: Journal of Electrical & Computer Engineering; 7/17/2024, Vol. 2024, p1-13, 13p
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Alternate Title: Research and Application of an Optimization Method for Power Grid Error Prevention and Control. (English)
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Quelle: Control Engineering of China; Nov2025, Vol. 32 Issue 11, p2073-2080, 8p
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Quelle: IEEE Transactions on Vehicular Technology; Jul2020, Vol. 69 Issue 7, p6943-6951, 9p
Schlagwörter: DEEP learning, ALGORITHMS, BEHAVIOR
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Quelle: Quality & Reliability Engineering International; Mar2024, Vol. 40 Issue 2, p819-837, 19p
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Autoren: et al.
Quelle: Algorithms; Nov2025, Vol. 18 Issue 11, p700, 20p
Schlagwörter: DEEP learning, FAULT diagnosis, PATTERN perception
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Autoren: et al.
Quelle: PLoS ONE; 10/6/2025, Vol. 20 Issue 10, p1-22, 22p
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Autoren: et al.
Quelle: Cluster Computing; Feb2026, Vol. 29 Issue 1, p1-19, 19p
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Autoren: et al.
Quelle: EURASIP Journal on Advances in Signal Processing; 9/29/2025, Vol. 2025 Issue 1, p1-19, 19p
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Quelle: Applied Intelligence; Sep2025, Vol. 55 Issue 14, p1-13, 13p
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Quelle: Artificial Intelligence Review; Sep2025, Vol. 58 Issue 9, p1-43, 43p
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