Search Results - combinational-circuit decoding complexity*

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    Source: 2012 IEEE Symposium on Electrical & Electronics Engineering (EEESYM); 1/ 1/2012, p345-348, 4p

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    Authors: Savage, J.

    Source: IEEE Transactions on Information Theory; 1969, Vol. 15 Issue 6, p689-695, 7p

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    Authors: Amir, K. Eric, B.

    Source: Proceedings 2001 IEEE International Symposium on Defect & Fault Tolerance in VLSI Systems; 2001, p308-313, 6p

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    Source: IET Communications (Institution of Engineering & Technology); 11/4/2011, Vol. 5 Issue 16, p2317-2327, 11p, 5 Diagrams, 3 Charts, 3 Graphs

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