Search Results - acm: d.: software/d.4: operating system/d.4.5: reliability/d.4.5.3: verification~
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1
Authors: et al.
Contributors: et al.
Source: https://inria.hal.science/inria-00379155 ; 2009.
Subject Terms: ACM: D.: Software, ACM: D.: Software/D.4: OPERATING SYSTEMS/D.4.6: Security and Protection, ACM: D.: Software/D.4: OPERATING SYSTEMS/D.4.5: Reliability, [INFO.INFO-NI]Computer Science [cs]/Networking and Internet Architecture [cs.NI]
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2
Authors: et al.
Contributors: et al.
Source: https://hal.sorbonne-universite.fr/hal-01540339 ; [Research Report] UPMC Sorbonne Universités. 2017.
Subject Terms: ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification, ACM: D.: Software/D.4: OPERATING SYSTEMS/D.4.5: Reliability, ACM: C.: Computer Systems Organization/C.2: COMPUTER-COMMUNICATION NETWORKS/C.2.2: Network Protocols/C.2.2.2: Protocol verification, [INFO.INFO-DC]Computer Science [cs]/Distributed, Parallel, and Cluster Computing [cs.DC], [INFO.INFO-CC]Computer Science [cs]/Computational Complexity [cs.CC], [INFO.INFO-DS]Computer Science [cs]/Data Structures and Algorithms [cs.DS], [INFO.INFO-IU]Computer Science [cs]/Ubiquitous Computing, [INFO.INFO-RB]Computer Science [cs]/Robotics [cs.RO], [INFO.INFO-LO]Computer Science [cs]/Logic in Computer Science [cs.LO]
Relation: info:eu-repo/semantics/altIdentifier/arxiv/1706.05193; ARXIV: 1706.05193
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3
Authors: et al.
Contributors: et al.
Source: Proceedings of AVOCS 2017 ; Formal Methods for Industrial Critical Systems and Automated Verification of Critical Systems (FMICS/AVOCS) ; https://hal.sorbonne-universite.fr/hal-01549942 ; Formal Methods for Industrial Critical Systems and Automated Verification of Critical Systems (FMICS/AVOCS), Sep 2017, Turin, Italy. pp.165-181, ⟨10.1007/978-3-319-67113-0_11⟩ ; https://easychair.org/cfp/FMICS-AVoCS2017
Subject Terms: ACM: C.: Computer Systems Organization/C.2: COMPUTER-COMMUNICATION NETWORKS/C.2.4: Distributed Systems, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.1: Requirements/Specifications, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.2: Design Tools and Techniques, ACM: D.: Software/D.3: PROGRAMMING LANGUAGES/D.3.1: Formal Definitions and Theory, ACM: D.: Software/D.4: OPERATING SYSTEMS/D.4.5: Reliability, [INFO.INFO-DC]Computer Science [cs]/Distributed, Parallel, and Cluster Computing [cs.DC], [INFO.INFO-CG]Computer Science [cs]/Computational Geometry [cs.CG], [INFO.INFO-DS]Computer Science [cs]/Data Structures and Algorithms [cs.DS], [INFO.INFO-NI]Computer Science [cs]/Networking and Internet Architecture [cs.NI], [INFO.INFO-FL]Computer Science [cs]/Formal Languages and Automata Theory [cs.FL], [INFO.INFO-RB]Computer Science [cs]/Robotics [cs.RO]
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4
Authors: et al.
Source: Programming & Computer Software; Jan2015, Vol. 41 Issue 1, p49-64, 16p
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5
Authors: et al.
Contributors: et al.
Source: http://www.nicta.com.au/pub?doc=7371.
Subject Terms: Categories and Subject Descriptors, D.2.4 [Software Engineering, Software/Program Verification, D.4.5 [Operating Systems, Reliability—Verification General Terms, Verification, Security, Reliability Additional Key Words and Phrases, seL4, Isabelle/HOL, operating systems, microkernel, L4 ACM Reference Format
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.431.9140; http://www.nicta.com.au/pub?doc=7371
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6
Authors: Klein, Gerwin
Source: Sādhanā: Academy Proceedings in Engineering Sciences; Feb2009, Vol. 34 Issue 1, p27-69, 43p, 8 Diagrams, 2 Charts
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7
Authors: et al.
Source: Communications of the ACM; Sep2012, Vol. 55 Issue 9, p69-77, 8p, 4 Diagrams
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8
Authors: et al.
Contributors: et al.
Source: Integrated Formal Methods - IFM 2010 ; https://hal.inria.fr/inria-00524575 ; Integrated Formal Methods - IFM 2010, INRIA Nancy Grand Est, Oct 2010, Nancy, France. pp.105-120
Subject Terms: Real-Time System, Pervasive Verification, Application Program, C Code Verification, Isabelle/HOL, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.1: Requirements/Specifications, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.2: Design Tools and Techniques, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification, [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE], [INFO.INFO-LO]Computer Science [cs]/Logic in Computer Science [cs.LO]
Relation: inria-00524575; https://hal.inria.fr/inria-00524575; https://hal.inria.fr/inria-00524575/document; https://hal.inria.fr/inria-00524575/file/libolos104.pdf
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9
Authors:
Source: Computation; Jul2023, Vol. 11 Issue 7, p135, 31p
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10
Authors:
Source: International Journal of Software & Informatics; 2024, Vol. 14 Issue 4, p349-351, 3p
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11
Authors: et al.
Contributors: et al.
Source: DTIC
Subject Terms: Computer Programming and Software, Computer Hardware, ARCHITECTURE, OPERATING SYSTEMS(COMPUTERS), VERIFICATION, SECURITY, KERNEL FUNCTIONS, RELIABILITY, WORKSHOPS, QUALITY ASSURANCE, DESIGN CRITERIA, AVOIDANCE, MEASUREMENT, SOFTWARE ENGINEERING, PROTECTION, MULTILEVEL SECURITY, PRINCIPLE OF LEAST PRIVILEGE, PARTIALLY ORDERED FLOWS, SCALABILITY, STRUCTURAL ABSTRACTIONS, archi, info
Availability: http://www.dtic.mil/docs/citations/ADA484370
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12
Authors:
Source: Communications of the ACM; Sep78, Vol. 21 Issue 9, p737-749, 13p
Subject Terms: COMPUTER operating systems, SOFTWARE verification
Geographic Terms: CALIFORNIA, UNITED States
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13
Authors: Shein, Esther
Source: Communications of the ACM; Aug2017, Vol. 60 Issue 8, p12-14, 3p, 2 Color Photographs, 2 Illustrations
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14
Authors: et al.
Contributors: et al.
Source: Integrated Formal Methods - IFM 2010 ; https://hal.inria.fr/inria-00524594 ; Integrated Formal Methods - IFM 2010, INRIA Nancy Grand Est, Oct 2010, Nancy, France. pp.275-289
Subject Terms: Event-B, refinement, control system, reliability, probability, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.1: Requirements/Specifications, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.2: Design Tools and Techniques, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification, [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE], [INFO.INFO-LO]Computer Science [cs]/Logic in Computer Science [cs.LO]
Relation: inria-00524594; https://hal.inria.fr/inria-00524594; https://hal.inria.fr/inria-00524594/document; https://hal.inria.fr/inria-00524594/file/ifm2010276.pdf
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15
Authors: et al.
Source: ACM Transactions on Autonomous & Adaptive Systems; 2012, Vol. 7 Issue 1, p1-9, 9p
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16
Authors: et al.
Contributors: et al.
Source: SEAMS 2011 ; https://inria.hal.science/inria-00578337 ; SEAMS 2011, ACM SIGSOFT / IEEE TCSE, May 2011, Honolulu, Hawaii, United States. pp.80-89, ⟨10.1145/1988008.1988020⟩ ; http://doi.acm.org/10.1145/1988008.1988020
Subject Terms: application of control theory, assessment and evaluation of self-adaptive systems, engineering of self-adaptive systems, run-time validation and verification, software adaptation metrics, software adaptation properties, software quality attributes, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification/D.2.4.6: Reliability, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification/D.2.4.8: Validation, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.8: Metrics/D.2.8.1: Performance measures, [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE]
Subject Geographic: Honolulu, Hawaii, United States
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17
Authors: et al.
Contributors: et al.
Source: Integrated Formal Methods - IFM 2010 ; https://hal.inria.fr/inria-00525179 ; Integrated Formal Methods - IFM 2010, INRIA Nancy Grand Est, Oct 2010, Nancy, France. pp.215-228
Subject Terms: Multiformalism, Model Transformation, Language Inheritance, Model Composition, System Reliability, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.1: Requirements/Specifications, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.2: Design Tools and Techniques, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification, [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE], [INFO.INFO-LO]Computer Science [cs]/Logic in Computer Science [cs.LO]
Relation: inria-00525179; https://hal.inria.fr/inria-00525179
Availability: https://hal.inria.fr/inria-00525179
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18
Authors: et al.
Contributors: et al.
Source: 2nd International Workshop on Reproducibility in Parallel Computing (RepPar)
https://inria.hal.science/hal-01161771
2nd International Workshop on Reproducibility in Parallel Computing (RepPar), Aug 2015, Vienne, Austria
http://reppar.org/Subject Terms: hpc, reproducible research, package management, gestion de paquets, répétabilité, calcul intensif, ACM: D.: Software/D.4: OPERATING SYSTEMS/D.4.5: Reliability/D.4.5.3: Verification, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.9: Management/D.2.9.5: Software configuration management, [INFO.INFO-DC]Computer Science [cs]/Distributed, Parallel, and Cluster Computing [cs.DC], [INFO.INFO-OS]Computer Science [cs]/Operating Systems [cs.OS], [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE]
Relation: info:eu-repo/semantics/altIdentifier/arxiv/1506.02822; ARXIV: 1506.02822
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19
Authors: et al.
Contributors: et al.
Source: Lecture Notes in Computer Science ; 1st International Conference on Theoretical Computer Science (TTCS) ; https://hal.science/hal-01202799 ; 1st International Conference on Theoretical Computer Science (TTCS), Aug 2015, Teheran, Iran. pp.90-104, ⟨10.1007/978-3-319-28678-5_7⟩
Subject Terms: real time model checking, time Petri nets, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification/D.2.4.3: Formal methods, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.4: Software/Program Verification/D.2.4.4: Model checking, ACM: D.: Software/D.4: OPERATING SYSTEMS/D.4.7: Organization and Design/D.4.7.4: Real-time systems and embedded systems, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems, [INFO.INFO-LO]Computer Science [cs]/Logic in Computer Science [cs.LO]
Relation: info:eu-repo/semantics/altIdentifier/arxiv/1509.06507; info:eu-repo/grantAgreement//11025/EU/ITEA3 OpenETCS/OpenETCS; ARXIV: 1509.06507
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20
Authors: et al.
Source: Sensors (14248220); May2025, Vol. 25 Issue 9, p2683, 21p
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