Search Results - acm: d.: software/d.4: operating system/d.4.5: reliability/d.4.5.2: fault-tolerance
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Subject Terms: Categories and Subject Descriptors, D.4.5 [Operating Systems, Reliability—Fault-tolerance, D.2.5 [Software Engineering, Testing and Debugging—Testing tools General Terms, Reliability Additional Key Words and Phrases, Fault injection, automated testing ACM Reference Format
File Description: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.485.9452; http://dslab.epfl.ch/pubs/faultInjection.pdf
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Authors: et al.
Contributors: et al.
Source: https://inria.hal.science/inria-00089975 ; [Research Report] PI 1810, 2006, pp.19.
Subject Terms: Systèmes répartis asynchrones, Tolérance aux fautes, Crash de processus, Oracle oméga, Détection de fautes, Leader inéluctable, Synchronie partielle\\ Assumption coverage, Asynchronous system, Distributed algorithm, Eventual $t$-source, Eventual leader, Failure detector, Fault-tolerance, Message pattern, Moving source, Omega, Partial synchrony, Process crash, System model, Timely link, ACM: D.: Software/D.2: SOFTWARE ENGINEERING/D.2.5: Testing and Debugging, ACM: D.: Software/D.4: OPERATING SYSTEMS/D.4.5: Reliability, ACM: D.: Software/D.4: OPERATING SYSTEMS/D.4.1: Process Management, [INFO.INFO-OS]Computer Science [cs]/Operating Systems [cs.OS]
Relation: Report N°: PI 1810
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Architecture-Based Reliability-Sensitive Criticality Measure for Fault-Tolerance Cloud Applications.
Authors: Wang, Lei
Source: IEEE Transactions on Parallel & Distributed Systems; Nov2019, Vol. 30 Issue 11, p2408-2421, 14p
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Source: ACM Transactions on Embedded Computing Systems; Mar2017, Vol. 16 Issue 3, p1-25, 25p
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Alternate Title: Методика оцінки характеристик надійності в проектуванні автоматичних систем реального часу. (Ukrainian)
Authors: et al.
Source: Proceedings of Odessa Polytechnic University / Odes'kyi Politechnichnyi Universytet Pratsi; 2020, Vol. 61 Issue 2, p108-118, 11p
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Authors: et al.
Source: IEEE Transactions on Reliability; Mar2021, Vol. 70 Issue 1, p13-48, 36p
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Authors: et al.
Source: Communications of the ACM; Nov2008, Vol. 51 Issue 11, p86-95, 10p
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Authors: et al.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Oct2018, Vol. 37 Issue 10, p2111-2124, 14p
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Source: IEEE Transactions on Reliability; Mar97, Vol. 46 Issue 1, p60, 9p, 5 Diagrams, 2 Charts
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Source: International Journal of Reliability, Quality & Safety Engineering; Feb2011, Vol. 18 Issue 1, p61-98, 38p, 10 Diagrams, 3 Charts, 1 Graph
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Source: IEEE Transactions on Reliability; Mar2022, Vol. 71 Issue 1, p63-74, 12p
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Source: ACM Journal on Emerging Technologies in Computing Systems; 2011, Vol. 7 Issue 1, p4-4.19, 19p
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Authors: ZHU, DAKAI
Source: ACM Transactions on Embedded Computing Systems; Dec2010, Vol. 10 Issue 2, p26-26-27, 27p
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Source: ACM Transactions on Embedded Computing Systems; Aug2010, Vol. 10 Issue 1, p2-2:29, 29p, 7 Diagrams, 2 Charts, 4 Graphs
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Source: ACM Computing Surveys; 2023 Suppl14s, Vol. 55, p1-30, 30p
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Source: Annals of Operations Research; Sep2016, Vol. 244 Issue 1, p241-255, 15p
Subject Terms: SOFTWARE reliability, SYSTEM failures, SOFTWARE upgrades, EMPIRICAL research, EVALUATION
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Source: Indonesian Journal of Electrical Engineering & Computer Science; Mar2025, Vol. 37 Issue 3, p1785-1796, 12p
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Authors: et al.
Source: ACM Transactions on Storage; 2010, Vol. 6 Issue 3, p11-11:30, 30p, 4 Diagrams, 9 Charts, 1 Graph
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Source: Electronics (2079-9292); Sep2022, Vol. 11 Issue 17, p2724, 38p
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Authors: et al.
Source: IEEE Transactions on Computers; Jun2012, Vol. 61 Issue 6, p767-779, 0p
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