Suchergebnisse - acm: d.: software/d.4: operable systems/d.4.5: reliability/d.4.5.2: fault-tolerance*
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Autoren: et al.
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Autoren: et al.
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Autoren: Lobanov, A.
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Autoren: et al.
Quelle: Mathematics (2227-7390); Feb2025, Vol. 13 Issue 3, p515, 19p
Schlagwörter: FAULT tolerance (Engineering), STRUCTURAL models
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Autoren:
Quelle: Software Quality Journal; Mar2020, Vol. 28 Issue 1, p173-194, 22p
Schlagwörter: SOFTWARE reliability, INTERVAL analysis, SYSTEMS software, TRANSIENT analysis
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Autoren:
Quelle: Reliability: Theory & Applications; Mar2017, Vol. 12 Issue 1, p18-25, 8p
Schlagwörter: REAL-time control, FAULT tolerance (Engineering)
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Autoren: et al.
Quelle: DAC: Annual ACM/IEEE Design Automation Conference; 2014, p1055-1060, 6p
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Quelle: Journal of Telecommunications & Information Technology; 2014, Vol. 2014 Issue 4, p44-52, 9p
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Alternate Title: ВПЛИВ СИСТЕМИ ЧИСЛЕННЯ В ЗАЛИШКОВИХ КЛАСАХ НА ВІДМОВОСТІЙКІСТЬ КОМП'ЮТЕРНОЇ СИСТЕМИ. (Ukrainian)
Autoren:
Quelle: Radioelectronic & Computer Systems / Radìoelektronnì ì Komp'ûternì Sistemi; 2023, Issue 3, p159-172, 14p
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Alternate Title: ПОВЫШЕНИЕ НАДЕЖНОСТИ ФУНКЦИОНИРОВАНИЯ ЭЛЕМЕНТОВ ИНФОРМАЦИОННО- УПРАВЛЯЮЩИХ СИСТЕМ С ИСПОЛЬЗОВАНИЕМ ВСТРОЕННЫХ СРЕДСТВ ДИАГНОСТИКИ. (Russian)
ПІДВИЩЕННЯ НАДІЙНОСТІ ФУНКЦІОНУВАННЯ ЕЛЕМЕНТІВ ІНФОРМАЦІЙНО-КЕРУЮЧИХ СИСТЕМ З ВИКОРИСТАННЯМ ВБУДОВАНИХ ЗАСОБІВ ДІАГНОСТИКИ. (Ukrainian)Autoren:
Quelle: Radio Electronics, Computer Science, Control; 2021, Issue 1, p158-171, 14p
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Autoren: Hristova, Mariya
Quelle: Cybernetics & Information Technologies; Jun2016, Vol. 16 Issue 2, p35-45, 11p
Schlagwörter: FAULT-tolerant computing, REAL-time control, REDUNDANCY in engineering
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Autoren: et al.
Quelle: Discover Applied Sciences; Jul2025, Vol. 7 Issue 7, p1-29, 29p
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Autoren:
Quelle: ACM Transactions on Embedded Computing Systems; Feb2010, Vol. 9 Issue 3, p26-26:25, 25p, 1 Black and White Photograph, 2 Diagrams, 3 Charts, 2 Graphs
Schlagwörter: SPACE vehicles, RADIATION, COMPUTER systems, COMPUTER architecture, NAVIGATION (Astronautics)
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Autoren: et al.
Quelle: Advances in Systems Science & Applications; 2024, Vol. 24 Issue 2, p166-186, 21p
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Autoren: et al.
Quelle: Sensors (14248220); May2021, Vol. 21 Issue 9, p3264-3264, 1p
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