Search Results - acm: b.: hardware/b.6: logic design/b.6.3: design art/b.6.3.0: automation synthesis
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Source: DAC: Annual ACM/IEEE Design Automation Conference; 2019, Issue 56, p1027-1032, 6p
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Source: IEEE Transactions on Computers; 1982, Vol. C-31 Issue 2, p93-109, 17p
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Authors: et al.
Source: Foundations & Trends in Electronic Design Automation; 2024, Vol. 14 Issue 4, p315-337, 23p
Subject Terms: LANGUAGE models, COMBINATIONAL circuits, INTEGRATED circuit verification, C++, GRAPES
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Authors: et al.
Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; May2019, Vol. 38 Issue 5, p898-911, 14p
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Source: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems; Nov2018, Vol. 37 Issue 11, p2802-2811, 10p
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Source: DAC: Annual ACM/IEEE Design Automation Conference; 2020, Issue 57, p1100-1105, 6p
Subject Terms: THRESHOLD logic, LINEAR programming, AUTOMATION, DEEP learning, MATHEMATICAL optimization
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Source: ACM Transactions on Embedded Computing Systems; May2023, Vol. 22 Issue 3, p1-34, 34p
Subject Terms: ELECTRONIC design automation, COMMUNITIES, RESEARCH questions, COMPUTER-aided design
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Source: Electronics (2079-9292); Nov2021, Vol. 10 Issue 22, p2817, 1p
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Authors: et al.
Source: ACM Transactions on Embedded Computing Systems; May2023, Vol. 22 Issue 3, p1-26, 26p
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Authors: et al.
Source: DAC: Annual ACM/IEEE Design Automation Conference; 2017, Issue 54, p493-498, 6p
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Source: IEEE Transactions on Applied Superconductivity; Jun2019, Vol. 29 Issue 4, p1-12, 12p
Subject Terms: GATE array circuits, VERILOG (Computer hardware description language), ELECTRONIC design automation, FIELD programmable gate arrays, ELECTRIC lines
Company/Entity: MASSACHUSETTS Institute of Technology
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Authors: et al.
Source: ACM Transactions on Embedded Computing Systems; Sep2021, Vol. 20 Issue 5, p1-21, 21p
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Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems; Jul2004, Vol. 12 Issue 7, p696-700, 5p, 3 Charts
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Authors: et al.
Contributors: et al.
Source: Design, Automation and Test in Europe (DATE 2019) ; https://hal.sorbonne-universite.fr/hal-02094516 ; Design, Automation and Test in Europe (DATE 2019), Mar 2019, Florence, Italy. pp.84-89
Subject Terms: ACM: B.: Hardware, [INFO.INFO-AR]Computer Science [cs]/Hardware Architecture [cs.AR], [SPI.TRON]Engineering Sciences [physics]/Electronics, [INFO.INFO-CR]Computer Science [cs]/Cryptography and Security [cs.CR]
Time: Florence, Italy
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Source: Philosophical Transactions of the Royal Society A: Mathematical, Physical & Engineering Sciences; 10/16/2020, Vol. 378 Issue 2182, p1-18, 18p
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Source: Journal of Supercomputing; May2021, Vol. 77 Issue 5, p4332-4374, 43p
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Source: Foundations & Trends in Electronic Design Automation; 2006, Vol. 1 Issue 3, p195-330, 137p
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Source: DAC: Annual ACM/IEEE Design Automation Conference; 2019, Issue 56, p1320-1354, 35p
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Source: IEEE Design & Test of Computers; 1986, Vol. 3 Issue 3, p6-13, 8p
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Authors: et al.
Source: IEEE Design & Test of Computers; Jul/Aug2009, Vol. 26 Issue 4, p8-17, 10p
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