Suchergebnisse - Performance and Reliability—Performance Anal- ysis and Design Aids General Terms Algorithm

Full-Chip Analysis of Leakage Power Under

Autoren: Hongliang Chang Sachin S. Sapatnekar The Pennsylvania State University CiteSeerX Archives

Weitere Verfasser: Hongliang Chang Sachin S. Sapatnekar The Pennsylvania State University CiteSeerX Archives

Quelle: http://www.cs.york.ac.uk/rts/docs/DAC-1964-2005/papers/2005/dac05/pdffiles/p523.pdf.

Schlagwörter: B.8.2 [Hardware, Performance and Reliability—Performance Anal- ysis and Design Aids General Terms Algorithm, Design, Performance, Reliability

Dateibeschreibung: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.575.5153

Verfügbarkeit: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.575.5153
http://www.cs.york.ac.uk/rts/docs/DAC-1964-2005/papers/2005/dac05/pdffiles/p523.pdf

Performance Bound Analysis of Analog Circuits Considering Process Variations.

Autoren: Hao, Zhigang Tan, Sheldon X.-D. Shen, Ruijing et al.

Quelle: DAC: Annual ACM/IEEE Design Automation Conference; Jun2011, p310-315, 6p, 5 Diagrams, 3 Charts, 2 Graphs

Schlagwörter: SYMBOLIC circuit analysis, INTERVAL analysis, TRANSFER functions, MONTE Carlo method, COMPUTER circuits

Statistical Characterization of Standard Cells Using Design of Experiments with Response Surface Modeling.

Autoren: Miranda, Miguel Roussel, Philippe Brusamarello, Lucas et al.

Quelle: DAC: Annual ACM/IEEE Design Automation Conference; Jun2011, p77-82, 6p, 2 Diagrams, 3 Charts, 4 Graphs

Schlagwörter: STANDARD cells, EXPERIMENTAL design, SENSITIVITY analysis, ELECTRIC battery design & construction

Firma/Körperschaft: EDA Exhibitions (Organization)

Fast Algorithms for IR Voltage Drop Analysis Exploiting Locality.

Autoren: Köse, Selçuk Friedman, Eby G.

Quelle: DAC: Annual ACM/IEEE Design Automation Conference; Jun2011, p996-1001, 6p, 4 Diagrams, 4 Charts, 4 Graphs

Schlagwörter: EUCLIDEAN algorithm, MICROPROCESSORS, LINEAR systems, ELECTRIC networks, INTEGRATED circuits, FLIP chip technology, ELECTRIC impedance

First-order incremental block-based statistical timing analysis.

Autoren: Visweswariah, C. Ravindran, K. Kalafala, K. et al.

Quelle: Proceedings 41st Design Automation Conference, 2004; 2004, p331-336, 6p

Accurate on-chip router area modeling with Kriging methodology.

Autoren: Dubois, Florentine Catalano, Valerio Coppola, Marcello et al.

Quelle: 2012 IEEE/ACM International Conference on Computer-Aided Design (ICCAD); 1/ 1/2012, p450-457, 8p

Full-Chip Leakage Analysis in Nano-scale Technologies: Mechanisms, Variation Sources, and Verification.

Autoren: Tao Li Wenjun Zhang Zhiping Yu

Quelle: DAC: Annual ACM/IEEE Design Automation Conference; 2008, p594-599, 6p, 2 Diagrams, 2 Charts, 7 Graphs

Schlagwörter: METAL oxide semiconductor field-effect transistors, COMPLEMENTARY metal oxide semiconductors, ALGORITHMS, RELIABILITY (Personality trait), ELECTRONICS

FPGA-based Accelerator for the Verification of Leading-Edge Wireless Systems.

Autoren: Alimohammad, Amirhossein Fard, Saeed F. Cockburn, Bruce F.

Quelle: DAC: Annual ACM/IEEE Design Automation Conference; Jul2009, p844-847, 4p, 1 Color Photograph, 2 Diagrams, 2 Charts, 2 Graphs

Schlagwörter: ERROR rates, WIRELESS communications, ANTENNAS (Electronics), COMPUTER software, GATE array circuits

Criticality computation in parameterized statistical timing.

Autoren: Jinjun Xiong Zolotov, V. Venkateswaran, N. et al.

Quelle: 2006 43rd ACM/IEEE Design Automation Conference; 2006, p63-68, 6p

On the Costs and Benefits of Stochasticity in Stream Processing.

Autoren: Nadakuditi, Raj R. Markov, Igor L.

Quelle: DAC: Annual ACM/IEEE Design Automation Conference; Jun2010, p320-325, 6p, 2 Diagrams, 1 Chart, 7 Graphs

Schlagwörter: INTEGRATED circuits, MOORE'S law, STOCHASTIC analysis, SPECTRAL theory, RANDOM matrices, COMPUTER simulation

Incremental Redundancy Cooperative Coding for Wireless Networks: Cooperative Diversity, Coding, and Transmission Energy Gains.

Autoren: Ruoheng Liu Spasojević, Predrag Soijanin, Emma

Quelle: IEEE Transactions on Information Theory; Mar2008, Vol. 54 Issue 3, p1207-1224, 18p

Schlagwörter: WIRELESS communications, TELECOMMUNICATION systems, DATA transmission systems, DIGITAL communications, ERROR rates, DATA corruption

On-chip power supply network optimization using multigrid-based technique.

Autoren: Kai Wang Marek-Sadowska, M.

Quelle: Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451); 2003, p113-118, 6p

Data Cache Locking for Tight Timing Calculations.

Autoren: Vera, Xavier Lisper, Björn Högskola, Mälardalens et al.

Quelle: ACM Transactions on Embedded Computing Systems; Dec2007, Vol. 7 Issue 1, p1-38, 38p, 16 Diagrams, 8 Charts, 4 Graphs

Schlagwörter: CACHE memory, EMBEDDED computer systems, SOURCE code, COMPUTER multitasking, COMPUTER software

Reliability Analysis and Improvement for Multi-Level Non-Volatile Memories with Soft Information.

Autoren: Shih-Liang Chen Bo-Ru Ke Jian-Nan Chen et al.

Quelle: DAC: Annual ACM/IEEE Design Automation Conference; Jun2011, p753-758, 6p, 3 Diagrams, 1 Chart, 8 Graphs

Schlagwörter: FLASH memory, ERROR rates, RELIABILITY (Personality trait), DECODERS & decoding, GAUSSIAN distribution

A fully physical model for leakage distribution under process variations in nanoscale double-gate CMOS.

Autoren: Ananthan, H. Roy, K.

Quelle: 2006 43rd ACM/IEEE Design Automation Conference; 2006, p413-418, 6p

Cognition in Organizations.

Autoren: Hodgkinson, Gerard P. Healey, Mark P.

Quelle: Annual Review of Psychology; 2008, Vol. 59 Issue 1, p387-417, 31p

Schlagwörter: COGNITION, LABOR supply, ASSOCIATIONS, institutions, etc., PSYCHOLOGY

Modeling Crosstalk in Statistical Static Timing Analysis.

Autoren: Gandikota, Ravikishore Blaauw, David Sylvester, Dennis

Quelle: DAC: Annual ACM/IEEE Design Automation Conference; 2008, p974-979, 6p, 1 Diagram, 1 Chart, 3 Graphs

Schlagwörter: NANOELECTROMECHANICAL systems, CROSSTALK, NOISE, STANDARD deviations, STATISTICAL correlation

High-performance Sustainable Materials and Structures

Autoren: Prince Lazar I. A. Palani Manish Kumar

Resource Type: eBook.

Schlagworte: Materials--Environmental aspects--Congresses, Sustainable engineering--Congresses

Categories: SCIENCE / Environmental Science, BUSINESS & ECONOMICS / Management, TECHNOLOGY & ENGINEERING / Materials Science / General

Precise Memory Leak Detection for Java Software Using Container Profiling.

Autoren: Guoqing Xu Atanas Rountev

Quelle: ICSE: International Conference on Software Engineering; 2008, p151-160, 10p, 3 Diagrams, 8 Charts, 2 Graphs

Schlagwörter: JAVA programming language, COMPUTER software, SOFTWARE engineering, INFORMATION technology, SOFTWARE architecture

An Efficient Placement and Routing Technique for Fault-Tolerant Distributed Embedded Computing.

Autoren: JAFARI, ROOZBEH GHASEMZADEH, HASSAN DABIRI, FOAD et al.

Quelle: ACM Transactions on Embedded Computing Systems; Jul2009, Vol. 8 Issue 4, p28-28-26, 26p, 1 Black and White Photograph, 5 Diagrams, 2 Charts, 12 Graphs

Schlagwörter: ROUTING (Computer network management), FAULT-tolerant computing, EMBEDDED computer systems, SENSOR networks, COMPUTER system failures