Search Results - Java bytecode instrumentation~
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Source: International Journal on Software Tools for Technology Transfer. Aug2023, Vol. 25 Issue 4, p453-479. 27p.
Subject Terms: *MODULAR design
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Source: https://inria.hal.science/hal-03533152 ; 2022.
Subject Terms: Instrumentation, Runtime Verification, Monitoring, Java, Bytecode, Aspect-Oriented Programming, Control Flow, Static and Dynamic Contexts, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems, [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE]
Relation: info:eu-repo/semantics/altIdentifier/arxiv/2106.01115; ARXIV: 2106.01115
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Source: Proceedings DARPA Information Survivability Conference and Exposition II. DISCEX'01. 2:27-40
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Source: Lecture Notes in Computer Science ISBN: 9783642351815
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Source: RV 2020 - 20th International Conference on Runtime Verification ; https://inria.hal.science/hal-03081265 ; RV 2020 - 20th International Conference on Runtime Verification, Oct 2020, Los Angeles, United States. pp.1-12
Subject Terms: Instrumentation, Runtime Verification, Monitoring, Java Bytecode, Aspect-Oriented Programming, Control Flow, Static and Dynamic Contexts, [INFO.INFO-ES]Computer Science [cs]/Embedded Systems, [INFO.INFO-SE]Computer Science [cs]/Software Engineering [cs.SE]
Subject Geographic: Los Angeles, United States
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Index Terms: 007.13, network middleware, Java bytecode instrumentation, embedded device, Departmental Bulletin Paper., VoR.
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Subject Terms: Categories and Subject Descriptors D.1.2 [Programming Techniques, Automatic Program- ming, D.2.8 [Software Engineering, Metrics—Perfor- mance measures General Terms Algorithms, Languages, Measurement Keywords Java, JVM, dynamic bytecode instrumentation, program transformations, dynamic metrics, profiling
File Description: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.464.8660; http://www.inf.usi.ch/faculty/binder/documents/pppj07.pdf
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Source: Proceedings of the 37th ACM/SIGAPP Symposium on Applied Computing. :1857-1861
Subject Terms: Java Bytecode, Typestate Analysis, [INFO.INFO-SE] Computer Science [cs]/Software Engineering [cs.SE], Runtime Verification, Parametric Monitoring, 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, Runtime Verification Typestate Analysis Parametric Monitoring Instrumentation Java Bytecode Control Flow, Instrumentation, Control Flow, [INFO.INFO-ES] Computer Science [cs]/Embedded Systems
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Source: Embedded device cooperative system using Java bytecode instrumentation. 51(1):16-20
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Subject Terms: Noise Injection, Java, Bytecode, Instrumentation, Concurrency, Error Detection, Domínio/Área Científica::Engenharia e Tecnologia::Engenharia Eletrotécnica, Eletrónica e Informática
File Description: application/pdf
Availability: http://hdl.handle.net/10362/151101
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Source: Труды Института системного программирования РАН, Vol 25, Iss 0, Pp 9-28 (2018)
Subject Terms: итеративный динамичеcкий анализ программ, автоматический поиск ошибок, анализ java программ, software iterative dynamic analysis, automatic defect detection, java bytecode instrumentation, Electronic computers. Computer science, QA75.5-76.95
File Description: electronic resource
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Source: Труды Института системного программирования РАН, Vol 27, Iss 1, Pp 25-38 (2018)
Subject Terms: статическая инструментация, динамический анализ, анализ программ, Electronic computers. Computer science, QA75.5-76.95
File Description: electronic resource
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Source: Science of Computer Programming
Subject Terms: Aspect-oriented programming, Recreating crashing conditions, Profiling, 0202 electrical engineering, electronic engineering, information engineering, Debugging, Bytecode instrumentation, Detecting memory leaks, Java Virtual Machine, 02 engineering and technology, Aspect weaving, Software
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Source: Proceedings of the 5th international symposium on Principles and practice of programming in Java - PPPJ '07 ; page 135
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Subject Terms: Java, JVM, dynamic bytecode instrumentation, program transformations, dynamic metrics, profiling, aspect-oriented programming
Relation: SCAM 2007 (Seventh IEEE International Working Conference on Source Code Analysis and Manipulation); https://infoscience.epfl.ch/handle/20.500.14299/9497
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