Suchergebnisse - Inject Detect Masking algorithm
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Autoren:
Quelle: Microprocessors and Microsystems. 77:103168
Schlagwörter: 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology
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Autoren: Anne, Mani Harsha
Quelle: Journal of International Crisis & Risk Communication Research (JICRCR); 2025 Supplement, Vol. 8, p351-358, 8p
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Autoren: et al.
Quelle: Buildings (2075-5309); Oct2025, Vol. 15 Issue 20, p3638, 20p
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Autoren: Gagniuc, Paul A.
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Quelle: Plant Methods; 10/3/2025, Vol. 21 Issue 1, p1-36, 36p
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Quelle: Foundations of Computing & Decision Sciences; Feb2025, Vol. 50 Issue 1, p27-55, 29p
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Quelle: Photonics; Oct2025, Vol. 12 Issue 10, p1030, 58p
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Quelle: Electronics (2079-9292); Aug2025, Vol. 14 Issue 16, p3315, 27p
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Quelle: Discover Internet of Things; 11/20/2025, Vol. 5 Issue 1, p1-25, 25p
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Autoren: et al.
Quelle: Remote Sensing; Nov2025, Vol. 17 Issue 21, p3576, 33p
Schlagwörter: DEEP learning, IMAGE segmentation, DETECTION algorithms, FEATURE extraction
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Autoren: et al.
Quelle: ACM Transactions on Intelligent Systems & Technology; Oct2025, Vol. 16 Issue 5, p1-72, 72p
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Autoren: et al.
Quelle: Expert Systems; Oct2024, Vol. 41 Issue 10, p1-14, 14p
Schlagwörter: ENCRYPTION protocols, RANDOM numbers, SYSTEMS software, ALGORITHMS, HARDWARE
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Alternate Title: Rail electrical continuity monitoring system to be integrated with axle counter systems. (English)
Autoren: et al.
Quelle: Ingegneria Ferroviaria; Oct2025, Vol. 80 Issue 10, p737-751, 15p
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Autoren: et al.
Quelle: Astrophysical Journal; 2025, Vol. 994 Issue 1, p1-33, 33p
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Autoren: et al.
Quelle: Photonics; Aug2025, Vol. 12 Issue 8, p809, 36p
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Autoren: et al.
Quelle: Ingénierie des Systèmes d'Information; Sep2025, Vol. 30 Issue 9, p2233-2252, 20p
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A comprehensive survey of deep face verification systems adversarial attacks and defense strategies.
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Quelle: Scientific Reports; 8/22/2025, Vol. 15 Issue 1, p1-22, 22p
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Quelle: International Scientific Journal of Engineering & Management; Jun2025, Vol. 4 Issue 6, p1-8, 8p
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Autoren: et al.
Quelle: Applied Sciences (2076-3417); Jul2025, Vol. 15 Issue 14, p7915, 21p
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Quelle: Sensors (14248220); Aug2025, Vol. 25 Issue 16, p5116, 27p
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